Flanner, III; Philip D.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Flanner, III; Philip D..The latest application filed is for "calculated electrical performance metrics for process monitoring and yield management".
- Flanner, III; Philip D. - Union City CA
| Patent | Date |
|---|---|
| Calculated electrical performance metrics for process monitoring and yield management Grant 10,079,183 - Gao , et al. September 18, 2 | 2018-09-18 |
| Techniques for optimized scatterometry Grant 9,127,927 - Iloreta , et al. September 8, 2 | 2015-09-08 |
| Calculated Electrical Performance Metrics For Process Monitoring And Yield Management App 20150006097 - Gao; Xiang ; et al. | 2015-01-01 |
| High throughput thin film characterization and defect detection Grant 8,711,349 - Gao , et al. April 29, 2 | 2014-04-29 |
| High Throughput Thin Film Characterization And Defect Detection App 20130083320 - Gao; Xiang ; et al. | 2013-04-04 |
| Film measurement using reflectance computation Grant 7,362,686 - Aoyagi , et al. April 22, 2 | 2008-04-22 |
| Film measurement Grant 7,345,761 - Aoyagi , et al. March 18, 2 | 2008-03-18 |
| Film measurement Grant 7,190,453 - Aoyagi , et al. March 13, 2 | 2007-03-13 |
| Method and system for calibrating an ellipsometer Grant 5,581,350 - Chen , et al. December 3, 1 | 1996-12-03 |
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