Fissan; Heinz

Patent Applications and Registrations

Patent applications and USPTO patent grants for Fissan; Heinz.The latest application filed is for "measurement of particle morphology using filtration".

Company Profile

0.6.6

Fissan; Heinz - Kerken DE
Fissan; Heinz - Kerken-Aledekerk DE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Measurement of particle morphology using filtration Grant 9,222,856 - Wang , et al. December 29, 2	2015-12-29
Measurement Of Particle Morphology Using Filtration App 20130174643 - Wang; Jing ; et al.	2013-07-11
Measurement system for the multidimensional aerosol characterization Grant 8,181,505 - Mertler , et al. May 22, 2	2012-05-22
Instruments for measuring nanoparticle exposure Grant 7,812,306 - Fissan , et al. October 12, 2	2010-10-12
Real-time monitoring of particles in semiconductor vacuum environment Grant 7,655,945 - Pui , et al. February 2, 2	2010-02-02
Real-time Monitoring Of Particles In Semiconductor Vacuum Environment App 20090206820 - Pui; David Y. ; et al.	2009-08-20
Measurement System For The Multidimensional Aerosol Characterization App 20090199623 - Mertler; Michael ; et al.	2009-08-13
Instruments for measuring nanoparticle exposure App 20060284077 - Fissan; Heinz ; et al.	2006-12-21
Apparatus for separating aerosols or particles from gases Grant 7,105,042 - Tumbrink , et al. September 12, 2	2006-09-12
Apparatus for separating aerosols or particles from gases App 20050235829 - Tumbrink, Manfred ; et al.	2005-10-27
Instrument for measuring and classifying nanometer aerosols Grant 6,230,572 - Pui , et al. May 15, 2	2001-05-15

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