Fischer; Lawrence S.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Fischer; Lawrence S..The latest application filed is for "apparatus and method for manipulating sample temperature for focused ion beam processing".
- Fischer; Lawrence S. - Poughkeepsie NY
| Patent | Date |
|---|---|
| Apparatus And Method For Manipulating Sample Temperature For Focused Ion Beam Processing App 20060065853 - Rue; Chad ; et al. | 2006-03-30 |
| Sample mount for performing sputter-deposition in a focused ion beam (FIB) tool Grant 6,946,064 - Fischer , et al. September 20, 2 | 2005-09-20 |
| Method for electrically characterizing charge sensitive semiconductor devices Grant 6,858,530 - Kane , et al. February 22, 2 | 2005-02-22 |
| Sample Mount For Performing Sputter-deposition In A Focused Ion Beam (fib) Tool App 20050006231 - Fischer, Lawrence S. ; et al. | 2005-01-13 |
| Dry etch process for copper App 20040132287 - Fischer, Lawrence S. ; et al. | 2004-07-08 |
| Structure and method for charge sensitive electrical devices App 20040089952 - Kane, Terence ; et al. | 2004-05-13 |
| Structure and method for charge sensitive electrical devices Grant 6,670,717 - Kane , et al. December 30, 2 | 2003-12-30 |
| Structure and method for charge sensitive electrical devices App 20030071361 - Kane, Terence ; et al. | 2003-04-17 |
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