Fiekowsky; Peter J.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Fiekowsky; Peter J..The latest application filed is for "fast image simulation for photolithography".
- Fiekowsky; Peter J. - Los Altos CA
| Patent | Date |
|---|---|
| Fast image simulation for photolithography Grant 7,472,372 - Fiekowsky , et al. December 30, 2 | 2008-12-30 |
| Fast image simulation for photolithography Grant 6,765,651 - Fiekowsky , et al. July 20, 2 | 2004-07-20 |
| Optical proximity correction serif measurement technique Grant 6,760,473 - Fiekowsky July 6, 2 | 2004-07-06 |
| Scanning-beam X-ray imaging system Grant 6,649,914 - Moorman , et al. November 18, 2 | 2003-11-18 |
| Microscopic corner radius measurement system Grant 6,397,165 - Fiekowsky May 28, 2 | 2002-05-28 |
| High accuracy particle dimension measurement system Grant 6,263,292 - Fiekowsky July 17, 2 | 2001-07-17 |
| High accuracy particle dimension measurement system Grant 6,167,355 - Fiekowsky December 26, 2 | 2000-12-26 |
| High accuracy particle dimension measurement system Grant 5,966,677 - Fiekowsky October 12, 1 | 1999-10-12 |
| Flat panel display inspection system Grant 5,764,209 - Hawthorne , et al. June 9, 1 | 1998-06-09 |
| Image reconstruction methods Grant 5,751,785 - Moorman , et al. May 12, 1 | 1998-05-12 |
| Scanning-beam X-ray imaging system Grant 5,729,584 - Moorman , et al. March 17, 1 | 1998-03-17 |
| Image reconstruction methods Grant 5,644,612 - Moorman , et al. July 1, 1 | 1997-07-01 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.
| 