Fiege; Ronald D.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Fiege; Ronald D..The latest application filed is for "monitoring stage alignment and related stage and calibration target".

Company Profile

0.6.6

Fiege; Ronald D. - Hopewell Junction NY US

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Monitoring stage alignment and related stage and calibration target Grant 8,411,270 - Zangooie , et al. April 2, 2	2013-04-02
Determining angle of incidence with respect to workpiece Grant 7,742,160 - Bottini , et al. June 22, 2	2010-06-22
Determining azimuth angle of incident beam to wafer Grant 7,646,491 - Zangooie , et al. January 12, 2	2010-01-12
Monitoring Stage Alignment And Related Stage And Calibration Target App 20090185183 - Zangooie; Shahin ; et al.	2009-07-23
Determining Angle Of Incidence With Respect To Workpiece App 20090180108 - Bottini; Clemente ; et al.	2009-07-16
Flipping stage arrangement for reduced wafer contamination cross section and improved measurement accuracy and throughput Grant 7,542,136 - Zangooie , et al. June 2, 2	2009-06-02
Optical Spot Geometric Parameter Determination Using Calibration Targets App 20090027660 - Zangooie; Shahin ; et al.	2009-01-29
Optical spot geometric parameter determination using calibration targets Grant 7,477,365 - Zangooie , et al. January 13, 2	2009-01-13
Flipping Stage Arrangement For Reduced Wafer Contamination Cross Section And Improved Measurement Accuracy And Throughput App 20090009763 - Zangooie; Shahin ; et al.	2009-01-08
Determining Azimuth Angle Of Incident Beam To Wafer App 20080316471 - Zangooie; Shahin ; et al.	2008-12-25
Optical spot geometric parameter determination using calibration targets App 20080024781 - Zangooie; Shahin ; et al.	2008-01-31

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