Feuerbaum; Hans-Peter

Patent Applications and Registrations

Patent applications and USPTO patent grants for Feuerbaum; Hans-Peter.The latest application filed is for "charged particle beam device with retarding field analyzer".

Company Profile

0.27.10

Feuerbaum; Hans-Peter - Munich DE
Feuerbaum; Hans-Peter - Heimstetten DE
Feuerbaum; Hans-Peter - Munchen DE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Charged particle beam device with retarding field analyzer Grant 8,203,119 - Degenhardt , et al. June 19, 2	2012-06-19
Focussing lens for charged particle beams Grant 7,652,263 - Feuerbaum January 26, 2	2010-01-26
Imaging system with multi source array Grant 7,638,777 - Feuerbaum , et al. December 29, 2	2009-12-29
Apparatus and method for inspecting a sample of a specimen by means of an electron beam Grant 7,586,093 - Feuerbaum September 8, 2	2009-09-08
Charged Particle Beam Device With Retarding Field Analyzer App 20090200463 - Degenhardt; Ralf ; et al.	2009-08-13
Focussing Lens for Charged Particle Beams App 20070262255 - Feuerbaum; Hans-Peter	2007-11-15
Charged particle beam apparatus and method for operating the same Grant 7,274,018 - Adamec , et al. September 25, 2	2007-09-25
Apparatus and method for inspecting a sample of a specimen by means of an electron beam App 20070057182 - Feuerbaum; Hans-Peter	2007-03-15
Imaging system with multi source array App 20060237659 - Feuerbaum; Hans Peter ; et al.	2006-10-26
Charged particle beam apparatus and method for operating the same App 20060192145 - Adamec; Pavel ; et al.	2006-08-31
Charged particle beam microscope with minicolumn Grant 7,075,092 - Winkler , et al. July 11, 2	2006-07-11
Charged particle beam apparatus and method for operating the same Grant 7,045,781 - Adamec , et al. May 16, 2	2006-05-16
Multi beam charged particle device Grant 6,943,349 - Adamec , et al. September 13, 2	2005-09-13
Optical column for charged particle beam device Grant 6,936,817 - Feuerbaum August 30, 2	2005-08-30
Charged particle beam microscope with minicolumn App 20040195522 - Winkler, Dieter ; et al.	2004-10-07
Charged particle beam apparatus and method for operating the same App 20040169141 - Adamec, Pavel ; et al.	2004-09-02
Charged particle beam microscope with minicolumn Grant 6,740,889 - Winkler , et al. May 25, 2	2004-05-25
Charged particle device Grant 6,730,907 - Feuerbaum , et al. May 4, 2	2004-05-04
Multi beam charged particle device App 20030168606 - Adamec, Pavel ; et al.	2003-09-11
Optical column for charged particle beam device App 20030155521 - Feuerbaum, Hans-Peter	2003-08-21
Method and device for focusing a charged particle beam Grant 6,555,824 - Feuerbaum , et al. April 29, 2	2003-04-29
Apparatus and method for examining specimen with a charged particle beam Grant 6,555,815 - Feuerbaum , et al. April 29, 2	2003-04-29
Apparatus And Method For Examing Specimen With A Charged Particle Beam App 20020053638 - WINKLER, DIETER ; et al.	2002-05-09
Device for corpuscular-optical examination and/or processing of material samples Grant 5,329,125 - Feuerbaum July 12, 1	1994-07-12
Method of operating an electron beam measuring device Grant 5,041,724 - Feuerbaum , et al. August 20, 1	1991-08-20
Detector objective for particle beam apparatus Grant 4,831,266 - Frosien , et al. May 16, 1	1989-05-16
Spectrometer objective for particle beam measuring instruments Grant 4,812,651 - Feuerbaum , et al. March 14, 1	1989-03-14
Method and apparatus for locating defects in an electrical circuit with a light beam Grant 4,733,176 - Feuerbaum March 22, 1	1988-03-22
Scanning particle microscope Grant 4,713,543 - Feuerbaum , et al. December 15, 1	1987-12-15
Method for automatically setting the voltage resolution in particle beam measuring devices and apparatus for implementation thereof Grant 4,686,466 - Feuerbaum , et al. August 11, 1	1987-08-11
Opposing field spectrometer for electron beam mensuration technology Grant 4,683,376 - Feuerbaum July 28, 1	1987-07-28
Secondary electron spectrometer for measuring voltages on a sample utilizing an electron probe Grant 4,514,682 - Feuerbaum April 30, 1	1985-04-30
Electron beam testing device for stroboscopic measurement of high-frequency, periodic events Grant 4,486,660 - Feuerbaum December 4, 1	1984-12-04
Arrangement for stroboscopic potential measurements with an electron beam testing device Grant 4,413,181 - Feuerbaum November 1, 1	1983-11-01
Techniques for impressing a voltage with an electron beam Grant 4,296,372 - Feuerbaum October 20, 1	1981-10-20
Method for the contactless measurement of the potential waveform in an electronic component and apparatus for implementing the method Grant 4,220,854 - Feuerbaum September 2, 1	1980-09-02
Apparatus for keying in electron beams Grant 4,169,229 - Feuerbaum September 25, 1	1979-09-25

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.