Ferng; Shyh-Shin

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ferng; Shyh-Shin.The latest application filed is for "semiconductor device and method of manufacturing".

Company Profile

4.5.6

Ferng; Shyh-Shin - Hsinchu TW
Ferng; Shyh-Shin - Hsin-Chu TW

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Test key design to enable X-ray scatterometry measurement Grant 11,071,513 - Ferng , et al. July 27, 2	2021-07-27
Semiconductor Device And Method Of Manufacturing App 20210126134 - Ferng; Shyh-Shin	2021-04-29
Non-contact method to monitor and quantify effective work function of metals Grant 10,763,179 - Marinskiy , et al. Sep	2020-09-01
Test Key Design to Enable X-Ray Scatterometry Measurement App 20200037979 - Ferng; Shyh-Shin ; et al.	2020-02-06
Test key design to enable X-ray scatterometry measurement Grant 10,499,876 - Ferng , et al. Dec	2019-12-10
Test Key Design to Enable X-Ray Scatterometry Measurement App 20190029634 - Ferng; Shyh-Shin ; et al.	2019-01-31
X-ray reflectometry apparatus for samples with a miniscule measurement area and a thickness in nanometers and method thereof Grant 10,151,713 - Wu , et al. Dec	2018-12-11
X-ray Reflectometry Apparatus For Samples With A Miniscule Measurement Area And A Thickness In Nanometers And Method Thereof App 20160341674 - WU; Wen-Li ; et al.	2016-11-24
Non-contact Method To Monitor And Quantify Effective Work Function Of Metals App 20160252565 - Marinskiy; Dmitriy ; et al.	2016-09-01

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