FENG; Mu
Patent Applications and Registrations
Patent applications and USPTO patent grants for FENG; Mu.The latest application filed is for "methods for improving process based contour information of structure in image".
- FENG; Mu - San Jose CA
Trademarks
| Patent | Date |
|---|---|
| Methods For Improving Process Based Contour Information Of Structure In Image App 20220299881 - ZHENG; Yunan ; et al. | 2022-09-22 |
| Prediction Data Selection For Model Calibration To Reduce Model Prediction Uncertainty App 20220276563 - WANG; Lei ; et al. | 2022-09-01 |
| Instant tuning method for accelerating resist and etch model calibration Grant 11,314,172 - Shi , et al. April 26, 2 | 2022-04-26 |
| Gauge Selection For Model Calibration App 20220113632 - WANG; Lei ; et al. | 2022-04-14 |
| Modeling Post-exposure Processes App 20210294218 - FAN; Yongfa ; et al. | 2021-09-23 |
| Method For Improving A Process For A Patterning Process App 20210208507 - WANG; Jen-Shiang ; et al. | 2021-07-08 |
| Instant Tuning Method For Accelerating Resist And Etch Model Calibration App 20210048751 - SHI; Hongfei ; et al. | 2021-02-18 |
| Methods Of Tuning Process Models App 20190369498 - FENG; Mu ; et al. | 2019-12-05 |
| Etch Bias Characterization And Method Of Using The Same App 20190354020 - FAN; Yongfa ; et al. | 2019-11-21 |
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