FELICI; Stefano
Patent Applications and Registrations
Patent applications and USPTO patent grants for FELICI; Stefano.The latest application filed is for "vertical probe head having an improved contact with a device under test".
- FELICI; Stefano - San Jose CA
- Felici; Stefano - Cernusco Lombardone IT
- Felici; Stefano - Robbiate IT
- Felici; Stefano - Merate IT
| Patent | Date |
|---|---|
| Vertical Probe Head Having An Improved Contact With A Device Under Test App 20210318355 - FELICI; Stefano | 2021-10-14 |
| Probe card for high-frequency applications Grant 11,112,431 - Felici September 7, 2 | 2021-09-07 |
| Vertical Probe Head With Improved Contact Properties Towards A Device Under Test App 20210255218 - FELICI; Stefano | 2021-08-19 |
| Probe card for high-frequency applications Grant 11,029,336 - Vettori , et al. June 8, 2 | 2021-06-08 |
| Probe card for electronics devices Grant 10,782,319 - Crippa , et al. Sept | 2020-09-22 |
| Probe Card For High-frequency Applications App 20190361050 - FELICI; STEFANO | 2019-11-28 |
| Probe Card For High-frequency Applications App 20190361051 - VETTORI; Riccardo ; et al. | 2019-11-28 |
| Probe Card For Electronic Devices App 20190113539 - CRIPPA; Roberto ; et al. | 2019-04-18 |
| Testing head of electronic devices Grant 9,829,508 - Felici , et al. November 28, 2 | 2017-11-28 |
| Testing Head Of Electronic Devices App 20150309076 - Felici; Stefano ; et al. | 2015-10-29 |
| Contact probe for a testing head having vertical probes for semiconductor integrated devices Grant 7,301,354 - Crippa , et al. November 27, 2 | 2007-11-27 |
| Testing head contact probe with an eccentric contact tip Grant 7,227,368 - Crippa , et al. June 5, 2 | 2007-06-05 |
| Contact probe for a testing head App 20050270044 - Crippa, Giuseppe ; et al. | 2005-12-08 |
| Contact probe for a testing head having vertical probes for semiconductor integrated devices App 20050110506 - Crippa, Giuseppe ; et al. | 2005-05-26 |
| Testing head having vertical probes for semiconductor integrated electronic devices Grant 6,768,327 - Felici , et al. July 27, 2 | 2004-07-27 |
| Testing head having cantilever probes Grant 6,674,298 - Felici , et al. January 6, 2 | 2004-01-06 |
| Contact probe for a testing head App 20030151419 - Felici, Stefano ; et al. | 2003-08-14 |
| Microstructure testing head Grant 6,515,496 - Felici , et al. February 4, 2 | 2003-02-04 |
| Testing head having vertical probes for semiconductor integrated electronic devices App 20020153910 - Felici, Stefano ; et al. | 2002-10-24 |
| Testing head having vertical probes App 20020070743 - Felici, Stefano ; et al. | 2002-06-13 |
| Testing head having cantilever probes App 20020067178 - Felici, Stefano ; et al. | 2002-06-06 |
| Microstructure testing head App 20020024347 - Felici, Stefano ; et al. | 2002-02-28 |
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