Feldman; Haim

Patent Applications and Registrations

Patent applications and USPTO patent grants for Feldman; Haim.The latest application filed is for "inspection of a three dimensional structure of a sample using a phase shift mask".

Company Profile

5.45.40

Feldman; Haim - Nof-Ayalon IL
FELDMAN; Haim - Nof-Ayalon 9 IL
Feldman; Haim - Nof-Avalon IL
Feldman; Haim - Nof-Aylon IL
Feldman; Haim - C'et-Ayalan IL
Feldman; Haim - Ayalon IL
Feldman; Haim - Vol-Ayabon IL
Feldman; Haim - Barevet IL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
System and method for defect detection using multi-spot scanning Grant 11,385,188 - Shoham , et al. July 12, 2	2022-07-12
Inspection of a three dimensional structure of a sample using a phase shift mask Grant 11,270,432 - Feldman , et al. March 8, 2	2022-03-08
Inspection Of A Three Dimensional Structure Of A Sample Using A Phase Shift Mask App 20220058784 - Feldman; Haim ; et al.	2022-02-24
Computerized system and method for obtaining information about a region of an object Grant 10,902,582 - Feldman , et al. January 26, 2	2021-01-26
Multi-perspective Wafer Analysis App 20200400589 - FELDMAN; Haim ; et al.	2020-12-24
Computerized System And Method For Obtaining Information About A Region Of An Object App 20200234418 - FELDMAN; Haim ; et al.	2020-07-23
Multi-perspective Wafer Analysis App 20200232934 - FELDMAN; Haim ; et al.	2020-07-23
Asymmetrical magnification inspection system and illumination module Grant 10,481,101 - Feldman , et al. Nov	2019-11-19
System and method for defect detection using multi-spot scanning Grant 10,386,311 - Shoham , et al. A	2019-08-20
Near-field sensor height control Grant 10,060,736 - Sagiv , et al. August 28, 2	2018-08-28
Asymmetrical Magnification Inspection System And Illumination Module App 20180209915 - Feldman; Haim ; et al.	2018-07-26
Evaluation system and a method for evaluating a substrate Grant 9,835,563 - Uziel , et al. December 5, 2	2017-12-05
System and method for defect detection using multi-spot scanning Grant 9,810,643 - Shoham , et al. November 7, 2	2017-11-07
Systems And Methods For Inspecting An Object App 20170016834 - Feldman; Haim ; et al.	2017-01-19
Systems and methods for inspecting an object Grant 9,535,014 - Feldman , et al. January 3, 2	2017-01-03
On-tool wavefront aberrations measurement system and method Grant 9,395,266 - Golberg , et al. July 19, 2	2016-07-19
Evaluation System And A Method For Evaluating A Substrate App 20160077016 - Uziel; Yoram ; et al.	2016-03-17
On-tool Wavefront Aberrations Measurement System And Method App 20150300913 - Golberg; Boris ; et al.	2015-10-22
Inspection method and an inspection system exhibiting speckle reduction characteristics Grant 9,012,875 - Shoham , et al. April 21, 2	2015-04-21
Inspection Method And An Inspection System Exhibiting Speckle Reduction Characteristics App 20140299790 - Shoham; Amir ; et al.	2014-10-09
Inspection system and method for fast changes of focus Grant 8,659,754 - Feldman , et al. February 25, 2	2014-02-25
Inspection System And Method For Fast Changes Of Focus App 20130342893 - Feldman; Haim ; et al.	2013-12-26
Inspection system and method for fast changes of focus Grant 8,488,117 - Feldman , et al. July 16, 2	2013-07-16
Scanning microscopy using inhomogeneous polarization Grant 8,228,601 - Meshulach , et al. July 24, 2	2012-07-24
Inspection System And Method For Fast Changes Of Focus App 20120086937 - Feldman; Haim ; et al.	2012-04-12
Illumination system for optical inspection Grant 8,134,699 - Naftali , et al. March 13, 2	2012-03-13
Illumination System For Optical Inspection App 20110170090 - Naftali; Ron ; et al.	2011-07-14
High resolution wafer inspection system Grant 7,973,919 - Grossman , et al. July 5, 2	2011-07-05
Illumination system for optical inspection Grant 7,924,419 - Naftali , et al. April 12, 2	2011-04-12
High Resolution Wafer Inspection System App 20100188658 - Grossman; Dan ; et al.	2010-07-29
High resolution wafer inspection system Grant 7,714,999 - Grossman , et al. May 11, 2	2010-05-11
Illumination System For Optical Inspection App 20100097680 - Naftali; Ron ; et al.	2010-04-22
Scanning microscopy Grant 7,684,048 - Meshulach , et al. March 23, 2	2010-03-23
Simulation of aerial images Grant 7,634,754 - Feldman December 15, 2	2009-12-15
Illumination system for optical inspection Grant 7,630,069 - Naftali , et al. December 8, 2	2009-12-08
Scanning Microscopy Using Inhomogeneous Polarization App 20090284835 - Meshulach; Doron ; et al.	2009-11-19
Simulation of aerial images Grant 7,620,932 - Feldman November 17, 2	2009-11-17
One-dimensional phase contrast microscopy with a traveling lens generated by a step function change Grant 7,576,348 - Feldman , et al. August 18, 2	2009-08-18
High throughput inspection system and a method for generating transmitted and/or reflected images Grant 7,518,718 - Elyasaf , et al. April 14, 2	2009-04-14
High Resolution Wafer Inspection System App 20080231845 - Grossman; Dan ; et al.	2008-09-25
Simulation Of Aerial Images App 20080152234 - Feldman; Haim	2008-06-26
Simulation Of Aerial Images App 20080152212 - Feldman; Haim	2008-06-26
Printer and a method for recording a multi-level image Grant 7,379,161 - Almogy , et al. May 27, 2	2008-05-27
One-dimensional Phase Contrast Microscopy App 20080116362 - Feldman; Haim ; et al.	2008-05-22
Methods and systems for optical inspection of surfaces based on laser screening Grant 7,342,218 - Almogy , et al. March 11, 2	2008-03-11
Dark field inspection system Grant 7,339,661 - Korngut , et al. March 4, 2	2008-03-04
Simulation of aerial images Grant 7,331,033 - Feldman February 12, 2	2008-02-12
Laser scanner with amplitude and phase detection Grant 7,286,239 - Feldman October 23, 2	2007-10-23
Scanning Microscopy App 20070109546 - Meshulach; Doron ; et al.	2007-05-17
High throughput inspection system and method for generating transmitted and/or reflected images Grant 7,187,439 - Elyasaf , et al. March 6, 2	2007-03-06
Illumination system for optical inspection App 20070008519 - Naftali; Ron ; et al.	2007-01-11
High Throughput Inspection System and a Method for Generating Transmitted and/or Reflected Images App 20060221331 - Elyasaf; Emanuel ; et al.	2006-10-05
Printer and a method for recording a multi-level image App 20060197931 - Almogy; Gilad ; et al.	2006-09-07
Wafer defect detection system with traveling lens multi-beam scanner Grant 7,053,395 - Feldman , et al. May 30, 2	2006-05-30
Printer and a method for recording a multi-level image Grant 7,053,985 - Almogy , et al. May 30, 2	2006-05-30
System and method for inspection of a substrate that has a refractive index Grant 7,030,978 - Guetta , et al. April 18, 2	2006-04-18
Simulation of aerial images App 20060048090 - Feldman; Haim	2006-03-02
Dual-spot phase-sensitive detection Grant 7,002,695 - Feldman February 21, 2	2006-02-21
High throughput inspection system and method for generating transmitted and/or reflected images App 20050270521 - Elyasaf, Emanuel ; et al.	2005-12-08
Dark field inspection system App 20050219518 - Korngut, Doron ; et al.	2005-10-06
Apparatus and method for dual spot inspection of repetitive patterns Grant 6,943,898 - Libinson , et al. September 13, 2	2005-09-13
Laser scanner with amplitude and phase detection Grant 6,937,343 - Feldman August 30, 2	2005-08-30
Laser scanner with amplitude and phase detection App 20050179907 - Feldman, Haim	2005-08-18
High throughput inspection system and method for generating transmitted and/or reflected images Grant 6,930,770 - Elyasaf , et al. August 16, 2	2005-08-16
Wafer defect detection system with traveling lens multi-beam scanner Grant 6,853,475 - Feldman , et al. February 8, 2	2005-02-08
System and method for inspection of a substrate that has a refractive index App 20040246474 - Guetta, Avishay ; et al.	2004-12-09
Wafer defect detection system with traveling lens multi-beam scanner Grant 6,809,808 - Feldman , et al. October 26, 2	2004-10-26
Dynamic automatic focusing method and apparatus using interference patterns Grant 6,794,625 - Feldman September 21, 2	2004-09-21
Eliminating coherence effects in bright-field laser imaging App 20040119001 - Almogy, Gilad ; et al.	2004-06-24
Focus error detection apparatus and method having dual focus error detection path Grant 6,750,436 - Feldman , et al. June 15, 2	2004-06-15
Wafer defect detection system with traveling lens multi-beam scanner App 20040080740 - Feldman, Haim ; et al.	2004-04-29
Wafer defect detection system with traveling lens multi-beam scanner App 20040075068 - Feldman, Haim ; et al.	2004-04-22
Laser scanner with amplitude and phase detection App 20040042014 - Feldman, Haim	2004-03-04
High throughput inspection system and method for generating transmitted and/or reflected images App 20040027563 - Elyasaf, Emanuel ; et al.	2004-02-12
Focus Error Detection Apparatus And Method App 20040007659 - Feldman, Haim ; et al.	2004-01-15
Scanning angle expander and a method for expanding a scanning beam angle Grant 6,671,098 - Feldman December 30, 2	2003-12-30
Scanning Angle Expander And A Method For Expanding A Scanning Beam Angle App 20030214723 - Feldman, Haim	2003-11-20
Dual-spot phase-sensitive detection App 20030210405 - Feldman, Haim	2003-11-13
Apparatus and method for dual spot inspection of repetitive patterns App 20030210402 - Libinson, Alexander ; et al.	2003-11-13
Wafer defect detection system with traveling lens multi-beam scanner App 20030179369 - Feldman, Haim ; et al.	2003-09-25
Focus error correction method and apparatus App 20020171028 - Feldman, Haim	2002-11-21
Focus error correction method and apparatus Grant 6,124,924 - Feldman , et al. September 26, 2	2000-09-26