Fei; Wang Jo
Patent Applications and Registrations
Patent applications and USPTO patent grants for Fei; Wang Jo.The latest application filed is for "system and method for implementing wafer acceptance test ("wat") advanced process control ("apc") with routing model".
- Fei; Wang Jo - Hsin-Chu N/A TW
- Fei; Wang Jo - Hsinchu TW
- Fei; Wang Jo - Hsinchu City TW
| Patent | Date |
|---|---|
| Advanced process control with novel sampling policy Grant 8,392,009 - Fei , et al. March 5, 2 | 2013-03-05 |
| Method and system for tuning advanced process control parameters Grant 8,229,588 - Tsen , et al. July 24, 2 | 2012-07-24 |
| System and method for implementing wafer acceptance test ("WAT") advanced process control ("APC") with routing model Grant 8,219,341 - Tsen , et al. July 10, 2 | 2012-07-10 |
| System And Method For Implementing Wafer Acceptance Test ("wat") Advanced Process Control ("apc") With Routing Model App 20100250172 - Tsen; Andy ; et al. | 2010-09-30 |
| Advanced Process Control With Novel Sampling Policy App 20100249974 - Fei; Wang Jo ; et al. | 2010-09-30 |
| Method And System For Tuning Advanced Process Control Parameters App 20100228370 - Tsen; Andy ; et al. | 2010-09-09 |
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