FEI EFA, Inc.

Patent Applications and Registrations

Patent applications and USPTO patent grants for FEI EFA, Inc..The latest application filed is for "method and system for resolving hot spots in lit".

Company Profile

12.31.7

FEI EFA, Inc. - Fremont CA US
FEI EFA, INC. - Freemont CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Laser-assisted device alteration using synchronized laser pulses Grant 11,353,479 - Vedagarbha , et al. June 7, 2	2022-06-07
Method and system for resolving hot spots in LIT Grant 11,022,646 - Schmidt June 1, 2	2021-06-01
Self correcting floating SIL tip Grant 10,718,933 - Frank , et al.	2020-07-21
Method And System For Resolving Hot Spots In Lit App 20200116782 - Schmidt; Christian	2020-04-16
System and method for fault isolation by emission spectra analysis Grant 10,620,263 - Deslandes , et al.	2020-04-14
Method and system for resolving hot spots in LIT Grant 10,545,186 - Schmidt Ja	2020-01-28
Laser-assisted Device Alteration Using Synchronized Laser Pulses App 20200025799 - Vedagarbha; Praveen ; et al.	2020-01-23
Through process flow intra-chip and inter-chip electrical analysis and process control using in-line nanoprobing Grant 10,539,589 - Ukraintsev , et al. Ja	2020-01-21
Self Correcting Floating Sil Tip App 20190155013 - Frank; Jonathan ; et al.	2019-05-23
Laser-assisted device alteration using synchronized laser pulses Grant 10,209,274 - Vedagarbha , et al. Feb	2019-02-19
Self correcting floating SIL tip Grant 10,133,051 - Frank , et al. November 20, 2	2018-11-20
System And Method For Fault Isolation By Emission Spectra Analysis App 20180328985 - Deslandes; Herve ; et al.	2018-11-15
Systems and method for laser voltage imaging Grant 10,126,360 - Vickers November 13, 2	2018-11-13
System and method for fault isolation by emission spectra analysis Grant 10,041,997 - Deslandes , et al. August 7, 2	2018-08-07
System and method for modulation mapping Grant 9,915,700 - Kasapi March 13, 2	2018-03-13
Spectral mapping of photo emission Grant 9,903,824 - Deslandes , et al. February 27, 2	2018-02-27
Method and system for the examination of a sample by means of thermography Grant 9,905,014 - Heissenstein , et al. February 27, 2	2018-02-27
Probe-based data collection system with adaptive mode of probing controlled by local sample properties Grant 9,891,280 - Ukraintsev , et al. February 13, 2	2018-02-13
Apparatus and method for annular optical power management Grant 9,885,878 - Serrels February 6, 2	2018-02-06
Method for imaging a feature using a scanning probe microscope Grant 9,869,696 - Erickson , et al. January 16, 2	2018-01-16
Method for examination of a sample by means of the heat flow thermography Grant 9,816,866 - Lang , et al. November 14, 2	2017-11-14
Optimized wavelength photon emission microscope for VLSI devices Grant 9,817,060 - Deslandes November 14, 2	2017-11-14

Company Registrations

NCAGE Code	511N5	FEI EFA, INC.!DBA DCG SYSTEMS
CAGE Code	511N5	FEI EFA, INC. DCG SYSTEMS
S.A.M. Registration	511N5 [809744480]	FEI EFA, INC. DCG SYSTEMS

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