Fay; Martin
Patent Applications and Registrations
Patent applications and USPTO patent grants for Fay; Martin.The latest application filed is for "interferometric metrology of surfaces, films and underresolved structures".
- Fay; Martin - Middletown CT
- Fay, Martin - Orwrigsburg PA
| Patent | Date |
|---|---|
| Interferometric Metrology Of Surfaces, Films And Underresolved Structures App 20120224183 - Fay; Martin ; et al. | 2012-09-06 |
| Data Interpolation Methods For Metrology Of Surfaces, Films And Underresolved Structures App 20120089365 - Fay; Martin ; et al. | 2012-04-12 |
| Polyester coetherified melamine formaldehyde copolymers App 20030138650 - Fay, Martin ; et al. | 2003-07-24 |
| Two stage thermoformable fluorinated polyoxetane-polyester copolymers App 20020127420 - Weinert, Raymond J. ; et al. | 2002-09-12 |
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