Farrell; Daniel James
Patent Applications and Registrations
Patent applications and USPTO patent grants for Farrell; Daniel James.The latest application filed is for "method and system for measuring coating thickness".
- Farrell; Daniel James - Cambridge GB
- Farrell; Daniel James - London N/A GB
| Patent | Date |
|---|---|
| Method And System For Measuring Coating Thickness App 20210310796 - Gregory; Ian Stephen ; et al. | 2021-10-07 |
| Method and system for measuring coating thickness Grant 11,085,755 - Gregory , et al. August 10, 2 | 2021-08-10 |
| Photoelectric conversion device Grant 9,795,542 - Nagashima , et al. October 24, 2 | 2017-10-24 |
| Photoelectric Conversion Device App 20140224305 - Nagashima; Tomonori ; et al. | 2014-08-14 |
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