Farnsworth, III; L. Owen
Patent Applications and Registrations
Patent applications and USPTO patent grants for Farnsworth, III; L. Owen.The latest application filed is for "method for optimizing a set of scan diagnostic patterns".
- Farnsworth, III; L. Owen - Lincoln VT
- Farnsworth, III; L. Owen - Bristol VT
| Patent | Date |
|---|---|
| Method for optimizing a set of scan diagnostic patterns Grant 6,996,791 - Brunkhorst , et al. February 7, 2 | 2006-02-07 |
| Internal cache for on chip test data storage Grant 6,901,542 - Bartenstein , et al. May 31, 2 | 2005-05-31 |
| Method of electrically blowing fuses under control of an on-chip tester interface apparatus Grant 6,768,694 - Anand , et al. July 27, 2 | 2004-07-27 |
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