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name:-0.012717962265015
name:-0.0063259601593018
name:-0.0055711269378662
Fan; Chi-Hsiang Patent Filings

Fan; Chi-Hsiang

Patent Applications and Registrations

Patent applications and USPTO patent grants for Fan; Chi-Hsiang.The latest application filed is for "method for determining stack configuration of substrate".

Company Profile
5.5.8
  • Fan; Chi-Hsiang - San Jose CA
  • Fan; Chi-Hsiang - Taipei TW
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Method of determining a position of a feature
Grant 11,392,044 - Huijgen , et al. July 19, 2
2022-07-19
Method for determining stack configuration of substrate
Grant 11,281,113 - Li , et al. March 22, 2
2022-03-22
Method For Determining Stack Configuration Of Substrate
App 20210247701 - LI; Danying ;   et al.
2021-08-12
Method For Determining An Etch Profile Of A Layer Of A Wafer For A Simulation System
App 20210150116 - Fan; Chi-Hsiang ;   et al.
2021-05-20
Metrology method and apparatus, substrate, lithographic method and associated computer product
Grant 10,802,409 - Fan , et al. October 13, 2
2020-10-13
Automatic selection of metrology target measurement recipes
Grant 10,782,616 - Wang , et al. Sept
2020-09-22
Method Of Determining A Position Of A Feature
App 20200150547 - HUIJGEN; Ralph Timotheus ;   et al.
2020-05-14
Method of determining a position of a feature
Grant 10,578,980 - Huijgen , et al.
2020-03-03
Method Of Determining A Position Of A Feature
App 20190339211 - HUIJGEN; Ralph Timotheus ;   et al.
2019-11-07
Automatic Selection Of Metrology Target Measurement Recipes
App 20190204750 - WANG; Daimian ;   et al.
2019-07-04
Apparatus And Method For Inferring Parameters Of A Model Of A Measurement Structure For A Patterning Process
App 20180239851 - YPMA; Alexander ;   et al.
2018-08-23
Metrology Method And Apparatus, Substrate, Lithographic Method And Associated Computer Product
App 20180238737 - FAN; Chi-Hsiang ;   et al.
2018-08-23
System And Method For Estimating Change Of Status Of Particle Beams
App 20120112086 - TSAI; Kuen-Yu ;   et al.
2012-05-10

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