loadpatents
name:-0.42525315284729
name:-0.11245393753052
name:-0.010721921920776
Faltermeier; Johnathan E. Patent Filings

Faltermeier; Johnathan E.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Faltermeier; Johnathan E..The latest application filed is for "high-k layer chamfering to prevent oxygen ingress in replacement metal gate (rmg) process".

Company Profile
1.58.57
  • Faltermeier; Johnathan E. - Delanson NY
  • Faltermeier; Johnathan E. - San Jose CA
  • Faltermeier; Johnathan E. - Albany NY US
  • Faltermeier; Johnathan E. - Lagrangeville NY
  • Faltermeier; Johnathan E. - Fishkill NY
  • Faltermeier, Johnathan E. - Lagrange NY
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Replacement metal gate stack for diffusion prevention
Grant 10,332,971 - Ando , et al.
2019-06-25
Gate structure cut after formation of epitaxial active regions
Grant 10,008,415 - Cai , et al. June 26, 2
2018-06-26
High-k Layer Chamfering To Prevent Oxygen Ingress In Replacement Metal Gate (rmg) Process
App 20180145150 - Ando; Takashi ;   et al.
2018-05-24
Replacement Metal Gate Stack For Diffusion Prevention
App 20180083117 - Ando; Takashi ;   et al.
2018-03-22
Replacement metal gate stack for diffusion prevention
Grant 9,905,665 - Ando , et al. February 27, 2
2018-02-27
High-K layer chamfering to prevent oxygen ingress in replacement metal gate (RMG) process
Grant 9,865,703 - Ando , et al. January 9, 2
2018-01-09
Partially dielectric isolated fin-shaped field effect transistor (FinFET)
Grant 9,735,277 - Cheng , et al. August 15, 2
2017-08-15
High-k Layer Chamfering To Prevent Oxygen Ingress In Replacement Metal Gate (rmg) Process
App 20170194459 - Ando; Takashi ;   et al.
2017-07-06
Partially Dielectric Isolated Fin-shaped Field Effect Transistor (finfet)
App 20170170323 - Cheng; Kangguo ;   et al.
2017-06-15
Gate Structure Cut After Formation Of Epitaxial Active Regions
App 20170140994 - Cai; Xiuyu ;   et al.
2017-05-18
Gate structure cut after formation of epitaxial active regions
Grant 9,633,906 - Cai , et al. April 25, 2
2017-04-25
Gate structure cut after formation of epitaxial active regions
Grant 9,559,009 - Cai , et al. January 31, 2
2017-01-31
Partially dielectric isolated fin-shaped field effect transistor (FinFET)
Grant 9,537,011 - Cheng , et al. January 3, 2
2017-01-03
Nitridation on HDP oxide before high-k deposition to prevent oxygen ingress
Grant 9,472,408 - Ando , et al. October 18, 2
2016-10-18
Nitridation on HDP oxide before high-k deposition to prevent oxygen ingress
Grant 9,412,596 - Ando , et al. August 9, 2
2016-08-09
Nitridation On Hdp Oxide Before High-k Deposition To Prevent Oxygen Ingress
App 20160225628 - Ando; Takashi ;   et al.
2016-08-04
Nitridation On Hdp Oxide Before High-k Deposition To Prevent Oxygen Ingress
App 20160225629 - Ando; Takashi ;   et al.
2016-08-04
Replacement Metal Gate Stack For Diffusion Prevention
App 20160197157 - Ando; Takashi ;   et al.
2016-07-07
FinFET spacer formation by oriented implantation
Grant 9,337,315 - Basker , et al. May 10, 2
2016-05-10
Method for improving device performance using epitaxially grown silicon carbon (SiC) or silicon-germanium (SiGe)
Grant 9,331,174 - Doris , et al. May 3, 2
2016-05-03
FinFET spacer formation by oriented implantation
Grant 9,318,578 - Basker , et al. April 19, 2
2016-04-19
Replacement metal gate stack for diffusion prevention
Grant 9,312,136 - Ando , et al. April 12, 2
2016-04-12
Semiconductor structure having buried conductive elements
Grant 9,263,454 - Alptekin , et al. February 16, 2
2016-02-16
Handler Wafer Removal By Use Of Sacrificial Inert Layer
App 20160035616 - Cheng; Kangguo ;   et al.
2016-02-04
Gate Structure Cut After Formation Of Epitaxial Active Regions
App 20160027700 - Cai; Xiuyu ;   et al.
2016-01-28
Semiconductor structure having buried conductive elements
Grant 9,245,892 - Alptekin , et al. January 26, 2
2016-01-26
finFETs containing improved strain benefit and self aligned trench isolation structures
Grant 9,240,447 - Cheng , et al. January 19, 2
2016-01-19
Semiconductor Structure Having Buried Conductive Elements
App 20150364476 - Alptekin; Emre ;   et al.
2015-12-17
Replacement Metal Gate Stack For Diffusion Prevention
App 20150255458 - Ando; Takashi ;   et al.
2015-09-10
Semiconductor Structure Having Buried Conductive Elements
App 20150236024 - Alptekin; Emre ;   et al.
2015-08-20
Gate Structure Cut After Formation Of Epitaxial Active Regions
App 20150214219 - Cai; Xiuyu ;   et al.
2015-07-30
Highly scalable trench capacitor
Grant 8,932,932 - Cheng , et al. January 13, 2
2015-01-13
Device structure, layout and fabrication method for uniaxially strained transistors
Grant 8,933,515 - Bedell , et al. January 13, 2
2015-01-13
Uniform finFET gate height
Grant 8,928,057 - Cote , et al. January 6, 2
2015-01-06
High-K/metal gate CMOS finFET with improved pFET threshold voltage
Grant 8,901,664 - Basker , et al. December 2, 2
2014-12-02
Uniform Finfet Gate Height
App 20140151772 - Cote; William ;   et al.
2014-06-05
Finfet Spacer Formation By Oriented Implantation
App 20140131801 - Basker; Veeraraghavan S. ;   et al.
2014-05-15
FinFET spacer formation by oriented implantation
Grant 8,716,797 - Basker , et al. May 6, 2
2014-05-06
Method of forming a planar field effect transistor with embedded and faceted source/drain stressors on a silicon-on-insulator (SOI) wafer, a planar field effect transistor structure and a design structure for the planar field effect transistor
Grant 8,525,186 - Cheng , et al. September 3, 2
2013-09-03
Stress enhanced transistor devices and methods of making
Grant 8,513,718 - Faltermeier , et al. August 20, 2
2013-08-20
Highly Scalable Trench Capacitor
App 20130203234 - Cheng; Kangguo ;   et al.
2013-08-08
Highly scalable trench capacitor
Grant 8,492,817 - Cheng , et al. July 23, 2
2013-07-23
Spacer as hard mask scheme for in-situ doping in CMOS finFETs
Grant 8,420,464 - Basker , et al. April 16, 2
2013-04-16
Self-aligned patterned etch stop layers for semiconductor devices
Grant 8,367,544 - Cheng , et al. February 5, 2
2013-02-05
Finfet Spacer Formation By Oriented Implantation
App 20130020642 - Basker; Veeraraghavan S. ;   et al.
2013-01-24
Defect Free Si:C Epitaxial Growth
App 20120305940 - Adam; Thomas N. ;   et al.
2012-12-06
Spacer As Hard Mask Scheme For In-situ Doping In Cmos Finfets
App 20120280250 - Basker; Veeraraghavan S. ;   et al.
2012-11-08
Device Structure, Layout And Fabrication Method For Uniaxially Strained Transistors
App 20120261762 - BEDELL; STEPHEN W. ;   et al.
2012-10-18
Device structure, layout and fabrication method for uniaxially strained transistors
Grant 8,288,218 - Bedell , et al. October 16, 2
2012-10-16
Smooth and vertical semiconductor fin structure
Grant 8,268,729 - Cheng , et al. September 18, 2
2012-09-18
Stress enhanced transistor devices and methods of making
Grant 8,216,893 - Faltermeier , et al. July 10, 2
2012-07-10
Stress Enhanced Transistor Devices And Methods Of Making
App 20120168775 - Faltermeier; Johnathan E. ;   et al.
2012-07-05
METHOD FOR IMPROVING DEVICE PERFORMANCE USING EPITAXIALLY GROWN SILICON CARBON (SiC) OR SILICON-GERMANIUM (SiGe)
App 20110254015 - Doris; Bruce B. ;   et al.
2011-10-20
High-k/metal Gate Cmos Finfet With Improved Pfet Threshold Voltage
App 20110227165 - Basker; Veeraraghavan S. ;   et al.
2011-09-22
Method Of Forming A Planar Field Effect Transistor With Embedded And Faceted Source/drain Stressors On A Silicon-on-insulator (soi) Wafer, A Planar Field Effect Transistor Structure And A Design Structure For The Planar Field Effect Transistor
App 20110204384 - Cheng; Kangguo ;   et al.
2011-08-25
High-K/metal gate CMOS finFET with improved pFET threshold voltage
Grant 7,993,999 - Basker , et al. August 9, 2
2011-08-09
Device Structure, Layout And Fabrication Method For Uniaxially Strained Transistors
App 20110175164 - Bedell; Stephen W. ;   et al.
2011-07-21
Method of forming a planar field effect transistor with embedded and faceted source/drain stressors on a silicon-on-insulator (S0I) wafer, a planar field effect transistor structure and a design structure for the planar field effect transistor
Grant 7,951,657 - Cheng , et al. May 31, 2
2011-05-31
High-k/metal Gate Cmos Finfet With Improved Pfet Threshold Voltage
App 20110108920 - BASKER; VEERARAGHAVAN S. ;   et al.
2011-05-12
Finfet Spacer Formation By Oriented Implantation
App 20110101455 - Basker; Veeraraghavan S. ;   et al.
2011-05-05
Source/drain junction for high performance MOSFET formed by selective EPI process
Grant 7,932,136 - Hua , et al. April 26, 2
2011-04-26
Self-aligned Patterned Etch Stop Layers For Semiconductor Devices
App 20110092069 - Cheng; Kangguo ;   et al.
2011-04-21
DRAM having deep trench capacitors with lightly doped buried plates
Grant 7,923,815 - Wang , et al. April 12, 2
2011-04-12
Self-aligned contact
Grant 7,888,252 - Faltermeier , et al. February 15, 2
2011-02-15
Device With Stressed Channel
App 20110031503 - Doris; Bruce B. ;   et al.
2011-02-10
Method Of Forming A Planar Field Effect Transistor With Embedded And Faceted Source/drain Stressors On A Silicon-on-insulator (soi) Wafer, A Planar Field Effect Transistor Structure And A Design Structure For The Planar Field Effect Transistor
App 20100295127 - Cheng; Kangguo ;   et al.
2010-11-25
Uniform recess of a material in a trench independent of incoming topography
Grant 7,833,872 - Cheng , et al. November 16, 2
2010-11-16
Highly Scalable Trench Capacitor
App 20100207245 - Cheng; Kangguo ;   et al.
2010-08-19
Self-aligned Contact
App 20100210098 - Faltermeier; Johnathan E. ;   et al.
2010-08-19
Stress Enhanced Transistor Devices And Methods Of Making
App 20100187578 - Faltermeier; Johnathan E. ;   et al.
2010-07-29
Providing isolation for wordline passing over deep trench capacitor
Grant 7,705,386 - Cheng , et al. April 27, 2
2010-04-27
Smooth and vertical semiconductor fin structure
App 20100048027 - Cheng; Kangguo ;   et al.
2010-02-25
Source/drain Junction For High Performance Mosfet Formed By Selective Epi Process
App 20090267149 - Hua; Xuefeng ;   et al.
2009-10-29
Providing Isolation For Wordline Passing Over Deep Trench Capacitor
App 20090173980 - Cheng; Kangguo ;   et al.
2009-07-09
Dram Having Deep Trench Capacitors With Lightly Doped Buried Plates
App 20090174031 - Wang; Geng ;   et al.
2009-07-09
Method Of Forming A Bottle-shaped Trench By Ion Implantation
App 20090170331 - Cheng; Kangguo ;   et al.
2009-07-02
Polysilicon hard mask for enhanced alignment signal
Grant 7,547,608 - Cheng , et al. June 16, 2
2009-06-16
Uniform Recess Of A Material In A Trench Independent Of Incoming Topography
App 20090108306 - Cheng; Kangguo ;   et al.
2009-04-30
Methods For Forming Nested And Isolated Lines In Semiconductor Devices
App 20090104776 - Dobuzinsky; David M. ;   et al.
2009-04-23
Dual Shallow Trench Isolation Structure
App 20090072355 - Cheng; Kangguo ;   et al.
2009-03-19
Trench capacitor with void-free conductor fill
Grant 7,494,891 - Cheng , et al. February 24, 2
2009-02-24
Semiconductor Etching Methods
App 20090047791 - Dobuzinsky; David M. ;   et al.
2009-02-19
STI formation in semiconductor device including SOI and bulk silicon regions
Grant 7,394,131 - Steigerwalt , et al. July 1, 2
2008-07-01
Trench Capacitor with Void-Free Conductor Fill
App 20080076230 - Cheng; Kangguo ;   et al.
2008-03-27
Trench Capacitor Having Lateral Extensions In Only One Direction And Related Methods
App 20070267671 - Cheng; Kangguo ;   et al.
2007-11-22
Polysilicon Hard Mask For Enhanced Alignment Signal
App 20070262475 - Cheng; Kangguo ;   et al.
2007-11-15
Low-cost deep trench decoupling capacitor device and process of manufacture
Grant 7,193,262 - Ho , et al. March 20, 2
2007-03-20
Sti Formation In Semiconductor Device Including Soi And Bulk Silicon Regions
App 20060244093 - Steigerwalt; Michael D. ;   et al.
2006-11-02
STI formation in semiconductor device including SOI and bulk silicon regions
Grant 7,118,986 - Steigerwalt , et al. October 10, 2
2006-10-10
Microelectronic element having trench capacitors with different capacitance values
Grant 7,084,449 - Cheng , et al. August 1, 2
2006-08-01
Low-Cost Deep Trench Decoupling Capacitor Device and Process of Manufacture
App 20060124982 - Ho; Herbert L. ;   et al.
2006-06-15
Sti Formation In Semiconductor Device Including Soi And Bulk Silicon Regions
App 20050282392 - Steigerwalt, Michael D. ;   et al.
2005-12-22
Microelectronic Element Having Trench Capacitors With Different Capacitance Values
App 20050280063 - Cheng, Kangguo ;   et al.
2005-12-22
STI formation for vertical and planar transistors
Grant 6,893,938 - Naeem , et al. May 17, 2
2005-05-17
Self-aligned Array Contact For Memory Cells
App 20050077562 - Divakaruni, Rama ;   et al.
2005-04-14
Self-aligned array contact for memory cells
Grant 6,870,211 - Divakaruni , et al. March 22, 2
2005-03-22
Method to improve bitline contact formation using a line mask
App 20050014332 - Maldei, Michael ;   et al.
2005-01-20
STI formation for vertical and planar transistors
App 20040209486 - Naeem, Munir D. ;   et al.
2004-10-21
Structure and method of forming bitline contacts for a vertical dram array using a line bitline contact mask
App 20040058480 - Nesbit, Larry A. ;   et al.
2004-03-25
Structure and method of forming bitline contacts for a vertical DRAM array using a line bitline contact mask
Grant 6,686,668 - Nesbit , et al. February 3, 2
2004-02-03
Deep slit isolation with controlled void
Grant 6,518,641 - Mandelman , et al. February 11, 2
2003-02-11
Oxidation of silicon nitride films in semiconductor devices
App 20020182893 - Ballantine, Arne W. ;   et al.
2002-12-05
Deep Slit Isolation With Controlled Void
App 20020171118 - Mandelman, Jack A. ;   et al.
2002-11-21
Structure and method of forming bitline contacts for a vertical DRAM array using a line bitline contact mask
App 20020093112 - Nesbit, Larry A. ;   et al.
2002-07-18
Variable stoichiometry silicon nitride barrier films for tunable etch selectivity and enhanced hyrogen permeability
Grant 6,268,299 - Jammy , et al. July 31, 2
2001-07-31
Quantum conductive recrystallization barrier layers
Grant 6,194,736 - Chaloux , et al. February 27, 2
2001-02-27

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