Evans; Andrew C

Patent Applications and Registrations

Patent applications and USPTO patent grants for Evans; Andrew C.The latest application filed is for "method for automated at-speed testing of high serial pin count multiple gigabit per second devices".

Company Profile

0.6.6

Evans; Andrew C - Aliso Viejo CA
Evans; Andrew C. - Aliso Viejo CA
Evans, Andrew C. - Aliso Viego CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Methods used to simultaneously perform automated at-speed testing of multiple gigabit per second high serial pin count devices Grant 7,502,326 - Evans March 10, 2	2009-03-10
Method for automated at-speed testing of high serial pin count multiple gigabit per second devices Grant 7,428,679 - Evans September 23, 2	2008-09-23
System for at-speed automated testing of high serial pin count multiple gigabit per second devices Grant 7,363,557 - Evans April 22, 2	2008-04-22
Test head utilized in a test system to perform automated at-speed testing of multiple gigabit per second high serial pin count devices Grant 7,278,079 - Evans October 2, 2	2007-10-02
Test system rider utilized for automated at-speed testing of high serial pin count multiple gigabit per second devices Grant 7,174,490 - Evans February 6, 2	2007-02-06
Test system rider board utilized for automated at-speed testing of high serial pin count multiple gigabit per second devices Grant 6,996,757 - Evans February 7, 2	2006-02-07
Method for automated at-speed testing of high serial pin count multiple gigabit per second devices App 20060020867 - Evans; Andrew C.	2006-01-26
Test system rider board utilized for automated at-speed testing of high serial pin count multiple gigabit per second devices App 20030208713 - Evans, Andrew C.	2003-11-06
Methods used to simultaneously perform automated at-speed testing of multiple gigabit per second high serial pin count devices App 20030193897 - Evans, Andrew C.	2003-10-16
Test head utilized in a test system to perform automated at-speed testing of multiple gigabit per second high serial pin count devices App 20030196153 - Evans, Andrew C.	2003-10-16
Test system rider board utilized for automated at-speed testing of high serial pin count multiple gigabit per second devices App 20030196151 - Evans, Andrew C.	2003-10-16
System for at-speed automated testing of high serial pin count multiple gigabit per second devices App 20030196139 - Evans, Andrew C.	2003-10-16

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