| Patent | Date |
|---|
Vibration Damping System For Charged Particle Beam Apparatus
App 20220208505 - ETOH; Jun ; et al. | 2022-06-30 |
Semiconductor memory device and defect remedying method thereof
Grant 7,499,340 - Kajigaya , et al. March 3, 2 | 2009-03-03 |
Semiconductor memory device and defect remedying method thereof
App 20080205111 - Kajigaya; Kazuhiko ; et al. | 2008-08-28 |
Semiconductor memory device and defect remedying method thereof
Grant 7,345,929 - Kajigaya , et al. March 18, 2 | 2008-03-18 |
Large scale integrated circuit with sense amplifier circuits for low voltage operation
Grant RE40,132 - Etoh , et al. March 4, 2 | 2008-03-04 |
Semiconductor memory device and defect remedying method thereof
App 20070242535 - Kajigaya; Kazuhiko ; et al. | 2007-10-18 |
Semiconductor memory device and defect remedying method thereof
Grant 7,203,101 - Kajigaya , et al. April 10, 2 | 2007-04-10 |
Method for manufacturing memory device provided with a defect recovery mechanism featuring a redundancy circuit
Grant 7,106,643 - Horiguchi , et al. September 12, 2 | 2006-09-12 |
Semiconductor memory device and defect remedying method thereof
App 20060120125 - Kajigaya; Kazuhiko ; et al. | 2006-06-08 |
Semiconductor memory device and defect remedying method thereof
Grant 7,016,236 - Kajigaya , et al. March 21, 2 | 2006-03-21 |
Semiconductor device having redundancy circuit
App 20050219922 - Horiguchi, Masashi ; et al. | 2005-10-06 |
Semiconductor memory device and defect remedying method thereof
App 20050179058 - Kajigaya, Kazuhiko ; et al. | 2005-08-18 |
Semiconductor device having redundancy circuit
Grant 6,909,647 - Horiguchi , et al. June 21, 2 | 2005-06-21 |
Semiconductor memory device and defect remedying method thereof
Grant 6,898,130 - Kajigaya , et al. May 24, 2 | 2005-05-24 |
Semiconductor memory device and defect remedying method thereof
App 20040240259 - Kajigaya, Kazuhiko ; et al. | 2004-12-02 |
Semiconductor device having redundancy circuit
App 20040184329 - Horiguchi, Masashi ; et al. | 2004-09-23 |
Semiconductor device having redundancy circuit
Grant 6,754,114 - Horiguchi , et al. June 22, 2 | 2004-06-22 |
Semiconductor device formed in a rectangle region on a semiconductor substrate including a voltage generating circuit
Grant 6,657,901 - Kajigaya , et al. December 2, 2 | 2003-12-02 |
Semiconductor device having redundancy circuit
App 20030189845 - Horiguchi, Masashi ; et al. | 2003-10-09 |
Semiconductor device formed in a rectangle region on a semiconductor substrate including a voltage generating circuit
App 20030031058 - Kajigaya, Kazuhiko ; et al. | 2003-02-13 |
Semiconductor memory device and defect remedying method thereof
App 20020054514 - Kajigaya, Kazuhiko ; et al. | 2002-05-09 |
Large scale integrated circuit with sense amplifier circuits for low voltage operation
Grant RE37,593 - Etoh , et al. March 19, 2 | 2002-03-19 |
Semiconductor device having redundancy circuit
App 20020031024 - Horiguchi, Masashi ; et al. | 2002-03-14 |
Semiconductor device having redundancy circuit
Grant 6,337,817 - Horiguchi , et al. January 8, 2 | 2002-01-08 |
Semiconductor memory device and defect remedying method thereof
Grant 6,160,744 - Kajigaya , et al. December 12, 2 | 2000-12-12 |
Semiconductor memory device and defect remedying method thereof
Grant 6,049,500 - Kajigaya , et al. April 11, 2 | 2000-04-11 |
Semiconductor device having redundancy circuit
Grant 5,617,365 - Horiguchi , et al. April 1, 1 | 1997-04-01 |
Semiconductor memory device and defect remedying method thereof
Grant 5,602,771 - Kajigaya , et al. February 11, 1 | 1997-02-11 |
Semiconductor memory device and defect remedying method thereof
Grant 5,579,256 - Kajigaya , et al. November 26, 1 | 1996-11-26 |
Ferroelectric memory
Grant 5,539,279 - Takeuchi , et al. July 23, 1 | 1996-07-23 |
Large scale integrated circuit with sense amplifier circuits for low voltage operation
Grant 5,526,313 - Etoh , et al. June 11, 1 | 1996-06-11 |
Method of testing an address multiplexed dynamic RAM
Grant 5,467,314 - Miyazawa , et al. * November 14, 1 | 1995-11-14 |
Reference voltage generator
Grant 5,455,797 - Etoh , et al. October 3, 1 | 1995-10-03 |
Semiconductor IC device having a voltage conversion circuit which generates an internal supply voltage having value compensated for external supply voltage variations
Grant 5,426,616 - Kajigaya , et al. June 20, 1 | 1995-06-20 |
Semiconductor memory having redundancy circuit
Grant 5,402,376 - Horiguchi , et al. * March 28, 1 | 1995-03-28 |
Reference voltage generator
Grant 5,384,740 - Etoh , et al. January 24, 1 | 1995-01-24 |
Large scale integrated circuit having low internal operating voltage
Grant 5,376,839 - Horiguchi , et al. December 27, 1 | 1994-12-27 |
Large scale integrated circuit for low voltage operation
Grant 5,297,097 - Etoh , et al. March 22, 1 | 1994-03-22 |
Semiconductor memory having redundancy circuit
Grant 5,265,055 - Horiguchi , et al. November 23, 1 | 1993-11-23 |
Semiconductor memory having redundancy circuit with means to switch power from a normal memory block to a spare memory block
Grant 5,262,993 - Horiguchi , et al. November 16, 1 | 1993-11-16 |
Large scale integrated circuit for low voltage operation
Grant 5,262,999 - Etoh , et al. November 16, 1 | 1993-11-16 |
Large scale integrated circuit having low internal operating voltage
Grant 5,254,880 - Horiguchi , et al. October 19, 1 | 1993-10-19 |
Large scale integrated circuit having low internal operating voltage
Grant 5,179,539 - Horiguchi , et al. January 12, 1 | 1993-01-12 |
Method of testing memory cells in an address multiplexed dynamic RAM including test mode selection
Grant 5,117,393 - Miyazawa , et al. * May 26, 1 | 1992-05-26 |
Semiconductor device having latch means
Grant 5,086,414 - Nambu , et al. February 4, 1 | 1992-02-04 |
Semiconductor device having a reference voltage generating circuit
Grant 4,994,688 - Horiguchi , et al. February 19, 1 | 1991-02-19 |
Method for selectively initiating/terminating a test mode in an address multiplexed DRAM and address multiplexed DRAM having such a capability
Grant 4,992,985 - Miyazawa , et al. * February 12, 1 | 1991-02-12 |
Dynamic random access memory capable of fast erasing of storage data
Grant 4,873,672 - Etoh , et al. October 10, 1 | 1989-10-10 |
Dynamic RAM device having a separate test mode capability
Grant 4,811,299 - Miyazawa , et al. March 7, 1 | 1989-03-07 |
Semiconductor memory having selectively activated blocks including CMOS sense amplifiers
Grant 4,796,234 - Itoh , et al. January 3, 1 | 1989-01-03 |
Dynamic type semiconductor monolithic memory
Grant 4,503,522 - Etoh , et al. March 5, 1 | 1985-03-05 |
Semiconductor memory
Grant 4,475,181 - Etoh , et al. October 2, 1 | 1984-10-02 |
Protective circuit and device for metal-oxide-semiconductor field effect transistor and method for fabricating the device
Grant 4,086,642 - Yoshida , et al. April 25, 1 | 1978-04-25 |
Semiconductor device and a method for fabricating the same
Grant 4,021,835 - Etoh , et al. May 3, 1 | 1977-05-03 |
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