Eto; Akira
Patent Applications and Registrations
Patent applications and USPTO patent grants for Eto; Akira.The latest application filed is for "grain quality level discrimination device".
- Eto; Akira - Tokyo JP
- Eto; Akira - Hiroshima JP
- Eto; Akira - Hino JP
| Patent | Date |
|---|---|
| Grain quality level discrimination device Grant 10,578,557 - Ishizuki , et al. | 2020-03-03 |
| Microorganism concentrator Grant 10,260,997 - Fukuyo , et al. | 2019-04-16 |
| Method for examining microorganisms and examination apparatus for microorganisms Grant 9,915,601 - Nakata , et al. March 13, 2 | 2018-03-13 |
| Grain Quality Level Discrimination Device App 20170350825 - ISHIZUKI; Hiroki ; et al. | 2017-12-07 |
| Microorganism Concentrator App 20160370261 - Fukuyo; Yasuo ; et al. | 2016-12-22 |
| Method for Examining Microorganisms and Examination Apparatus for Microorganisms App 20150219548 - Nakata; Akiko ; et al. | 2015-08-06 |
| Method and apparatus for controlling load of dynamometer Grant 4,257,261 - Ono , et al. March 24, 1 | 1981-03-24 |
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