Esmark; Kai

Patent Applications and Registrations

Patent applications and USPTO patent grants for Esmark; Kai.The latest application filed is for "silicon controlled rectifier and manufacturing method therefor".

Company Profile

2.32.35

Esmark; Kai - Neuried DE
Esmark; Kai - Neurled DE
Esmark; Kai - Munchen DE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Silicon controlled rectifier and manufacturing method therefor Grant 11,121,126 - Russ , et al. September 14, 2	2021-09-14
Avalanche diode having an enhanced defect concentration level and method of making the same Grant 10,756,081 - Schneider , et al. A	2020-08-25
Silicon Controlled Rectifier and Manufacturing Method Therefor App 20200243507 - Russ; Christian Cornelius ; et al.	2020-07-30
Integrated circuit including lateral insulated gate field effect transistor Grant 9,899,367 - Esmark , et al. February 20, 2	2018-02-20
Avalanche Diode Having an Enhanced Defect Concentration Level and Method of Making the Same App 20180033783 - Schneider; Jens ; et al.	2018-02-01
Avalanche diode having an enhanced defect concentration level and method of making the same Grant 9,812,438 - Schneider , et al. November 7, 2	2017-11-07
Integrated Circuit Including Lateral Insulated Gate Field Effect Transistor App 20160336308 - Esmark; Kai ; et al.	2016-11-17
Esd/eos Detection App 20160172849 - DIBRA; Donald ; et al.	2016-06-16
Avalanche Diode Having an Enhanced Defect Concentration Level and Method of Making the Same App 20160111413 - Schneider; Jens ; et al.	2016-04-21
Semiconductor ESD device and method of making same Grant 9,263,430 - Domanski , et al. February 16, 2	2016-02-16
Avalanche diode having an enhanced defect concentration level and method of making the same Grant 9,257,523 - Schneider , et al. February 9, 2	2016-02-09
Semiconductor ESD Device and Method of Making Same App 20150144996 - Domanski; Krzysztof ; et al.	2015-05-28
Method of forming a semiconductor device including a silicon controlled rectifier Grant 8,956,924 - Domanski , et al. February 17, 2	2015-02-17
Avalanche Diode Having an Enhanced Defect Concentration Level and Method of Making the Same App 20140291808 - Schneider; Jens ; et al.	2014-10-02
Avalanche diode having an enhanced defect concentration level and method of making the same Grant 8,791,547 - Schneider , et al. July 29, 2	2014-07-29
Methods of forming electrostatic discharge devices Grant 8,623,731 - Esmark January 7, 2	2014-01-07
Semiconductor ESD Device and Method of Making Same App 20130277712 - Domanski; Krzysztof ; et al.	2013-10-24
Semiconductor ESD device and method of making same Grant 8,471,292 - Domanski , et al. June 25, 2	2013-06-25
Methods of Forming Electrostatic Discharge Devices App 20130122677 - Esmark; Kai	2013-05-16
Electrostatic discharge devices Grant 8,350,355 - Esmark January 8, 2	2013-01-08
ESD and EMC optimized HV-MOS transistor Grant 8,304,806 - Mueller , et al. November 6, 2	2012-11-06
Semiconductor ESD Device and Method of Making Same App 20120218671 - Domanski; Krzysztof ; et al.	2012-08-30
Semiconductor ESD device and method of making same Grant 8,178,897 - Domanski , et al. May 15, 2	2012-05-15
Integrated circuit arrangement with shockley diode or thyristor and method for production and use of a thyristor Grant 8,129,292 - Glaser , et al. March 6, 2	2012-03-06
ESD and EMC optimized HV-MOS Transistor App 20110303948 - Mueller; Karl-heinz ; et al.	2011-12-15
Integrated circuit arrangements with ESD-resistant capacitor and corresponding method of production Grant 8,076,728 - Esmark , et al. December 13, 2	2011-12-13
Electrostatic Discharge Devices App 20110210418 - Esmark; Kai	2011-09-01
Semiconductor ESD device and method of making same Grant 7,985,983 - Russ , et al. July 26, 2	2011-07-26
Integrated circuit arrangement with Shockley diode or thyristor and method for production and use of a thyristor Grant 7,888,701 - Glaser , et al. February 15, 2	2011-02-15
Semiconductor ESD Device and Method of Making Same App 20100321843 - Domanski; Krzysztof ; et al.	2010-12-23
Semiconductor ESD device and method of making same Grant 7,800,128 - Domanski , et al. September 21, 2	2010-09-21
Semiconductor ESD Device and Method of Making Same App 20100208405 - Russ; Cornelius Christian ; et al.	2010-08-19
Semiconductor ESD device and method of making same Grant 7,732,834 - Russ , et al. June 8, 2	2010-06-08
Integrated Circuit Arrangement With Shockley Diode Or Thyristor And Method For Production And Use Of A Thyristor App 20100120208 - Glaser; Ulrich ; et al.	2010-05-13
Integrated Circuit Arrangement With Shockley Diode Or Thyristor And Method For Production And Use Of A Thyristor App 20100117116 - Glaser; Ulrich ; et al.	2010-05-13
Identification of ESD and latch-up weak points in an integrated circuit Grant 7,694,247 - Esmark , et al. April 6, 2	2010-04-06
Integrated circuit arrangement with shockley diode or thyristor and method for production and use of a thyristor Grant 7,679,103 - Glaser , et al. March 16, 2	2010-03-16
Semiconductor ESD Device and Method of Making Same App 20090309129 - Domanski; Krzysztof ; et al.	2009-12-17
Integrated Circuit Arrangements With ESD-Resistant Capacitor and Corresponding Method of Production App 20090283859 - Esmark; Kai ; et al.	2009-11-19
Integrated Circuit Arrangements With ESD-Resistant Capacitor and Corresponding Method of Production App 20090283810 - Esmark; Kai ; et al.	2009-11-19
ESD/EOS Performance by Introduction of Defects App 20090185316 - Schneider; Jens ; et al.	2009-07-23
Semiconductor ESD device and method of making same App 20080179624 - Russ; Cornelius Christian ; et al.	2008-07-31
Circuit for protecting integrated circuits against electrostatic discharges Grant 7,359,169 - Esmark , et al. April 15, 2	2008-04-15
ESD protection device Grant 7,279,726 - Esmark , et al. October 9, 2	2007-10-09
Esd test arrangement and method App 20070165344 - Esmark; Kai ; et al.	2007-07-19
Integrated circuit arrangement with shockley diode or thyristor and method for production and use of a thyristor App 20070158750 - Glaser; Ulrich ; et al.	2007-07-12
MOS transistor and ESD protective device each having a settable voltage ratio of the lateral breakdown voltage to the vertical breakdown voltage Grant 7,202,527 - Esmark , et al. April 10, 2	2007-04-10
Integrated circuit arrangements with ESD-resistant capacitor and corresponding method of production App 20070034959 - Esmark; Kai ; et al.	2007-02-15
Process and electrostatic discharge protection device for the protection of a semiconductor circuit App 20060261412 - Esmark; Kai ; et al.	2006-11-23
ESD protection device App 20060238937 - Esmark; Kai ; et al.	2006-10-26
ESD protective circuit with collector-current-controlled triggering for a monolithically integrated circuit Grant 7,087,938 - Streibl , et al. August 8, 2	2006-08-08
Circuit for protecting integrated circuits against electrostatic discharges App 20060056121 - Esmark; Kai ; et al.	2006-03-16
Method and device for testing the ESD resistance of a semiconductor component Grant 7,009,404 - Wendel , et al. March 7, 2	2006-03-07
Transistor comprising fill areas in the source drain and/or drain region App 20050263817 - Wendel, Martin ; et al.	2005-12-01
ESD protective circuit with collector-current-controlled triggering for a monolithically integrated circuit App 20050195540 - Streibl, Martin ; et al.	2005-09-08
Method for determining an ESD/latch-up strength of an integrated circuit Grant 6,930,501 - Bargstadt-Franke , et al. August 16, 2	2005-08-16
Operating method for a semiconductor component Grant 6,905,892 - Esmark , et al. June 14, 2	2005-06-14
Method for producing a MOS transistor and MOS transistor Grant 6,884,688 - Esmark , et al. April 26, 2	2005-04-26
MOS transistor and ESD protective device App 20050001270 - Esmark, Kai ; et al.	2005-01-06
Method for determining an ESD/latch-up strength of an integrated circuit App 20050003564 - Bargstadt-Franke, Silke ; et al.	2005-01-06
Method for producing a MOS transistor and MOS transistor App 20030064573 - Esmark, Kai ; et al.	2003-04-03
Operating method for a semiconductor component App 20030017676 - Esmark, Kai ; et al.	2003-01-23
Method and device for testing the ESD resistance of a semiconductor component App 20030006776 - Wendel, Martin ; et al.	2003-01-09

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.