Eriguchi; Koji

Patent Applications and Registrations

Patent applications and USPTO patent grants for Eriguchi; Koji.The latest application filed is for "defect density calculation method, defect-density calculation program, defect-density calculation apparatus, heat treatment control system and machining control system".

Company Profile

0.18.12

Eriguchi; Koji - Kyoto JP
ERIGUCHI; Koji - Ritto-shi JP
Eriguchi; Koji - Ritto JP
Eriguchi; Koji - Osaka JP
Eriguchi; Koji - Shiga JP
Eriguchi; Koji - Kusatsu JP
Eriguchi, Koji - Kusatsu-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Defect Density Calculation Method, Defect-density Calculation Program, Defect-density Calculation Apparatus, Heat Treatment Control System And Machining Control System App 20220189833 - Kuboi; Nobuyuki ; et al.	2022-06-16
Semiconductor Device And Method For Manufacturing The Same App 20090001473 - ERIGUCHI; Koji ; et al.	2009-01-01
Semiconductor device with dummy conductors Grant 7,432,556 - Eriguchi , et al. October 7, 2	2008-10-07
Semiconductor Device And Method For Manufacturing The Same App 20070108614 - Eriguchi; Koji ; et al.	2007-05-17
Semiconductor device Grant 6,974,987 - Ogawa , et al. December 13, 2	2005-12-13
Apparatus And Method For Optical Evaluation, Apparatus And Method For Manufacturing Semiconductor Device, Method Of Controlling Apparatus For Manufacturing Semiconductor Device, And Semiconductor Device Grant 6,849,470 - Eriguchi , et al. February 1, 2	2005-02-01
Semiconductor device and method for manufacturing the same App 20050006707 - Eriguchi, Koji ; et al.	2005-01-13
Semiconductor device and its manufacturing method App 20040150025 - Ogawa, Hisashi ; et al.	2004-08-05
Device for manufacturing semiconductor device and method of manufacturing the same Grant 6,750,976 - Eriguchi June 15, 2	2004-06-15
Aggregate of semiconductor micro-needles and method of manufacturing the same, and semiconductor apparatus and method of manufacturing the same Grant 6,734,451 - Eriguchi , et al. May 11, 2	2004-05-11
Method of forming a high dielectric constant insulating film and method of producing semiconductor device using the same Grant 6,734,069 - Eriguchi May 11, 2	2004-05-11
Apparatus And Method For Optical Evaluation, Apparatus And Method For Manufacturing Semiconductor Device, Method Of Controlling Apparatus For Manufacturing Semiconductor Device, And Semiconductor Device Grant 6,727,108 - Eriguchi , et al. April 27, 2	2004-04-27
Method and apparatus for evaluating insulating film Grant 6,720,790 - Eriguchi , et al. April 13, 2	2004-04-13
Device for manufacturing semiconductor device and method of manufacturing the same Grant 6,695,947 - Eriguchi February 24, 2	2004-02-24
Apparatus and method for optical evaluation, apparatus and method for manufacturing semiconductor device, method of controlling apparatus for manufacturing semiconductor device, and semiconductor device App 20030207476 - Eriguchi, Koji ; et al.	2003-11-06
Method and apparatus for evaluating insulating film App 20030169065 - Eriguchi, Koji ; et al.	2003-09-11
Method of forming insulating film and method of producing semiconductor device App 20030092238 - Eriguchi, Koji	2003-05-15
Aggregate of Semicnductor micro-needles and method of manufacturing the same, and semiconductor apparatus and method of manufacturing the same App 20030057451 - Eriguchi, Koji ; et al.	2003-03-27
Device for manufacturing semiconductor device and method of manufacturing the same App 20020135785 - Eriguchi, Koji	2002-09-26
Device for manufacturing semiconductor device and method of manufacturing the same App 20020129476 - Eriguchi, Koji	2002-09-19
Method and apparatus for semiconductor device fabrication Grant 6,372,082 - Eriguchi April 16, 2	2002-04-16
Method and apparatus for evaluating insulating film App 20020024351 - Eriguchi, Koji ; et al.	2002-02-28
Method of making aggregate of semiconductor micro-needles Grant 6,177,291 - Eriguchi , et al. January 23, 2	2001-01-23
Apparatus and method for optical evaluation, apparatus and method for manufacturing semiconductor device, method of controlling apparatus for manufacturing semiconductor device, and semiconductor device Grant 6,113,733 - Eriguchi , et al. September 5, 2	2000-09-05
Aggregate of semiconductor micro-needles and method of manufacturing the same, and semiconductor apparatus and method of manufacturing the same Grant 6,087,197 - Eriguchi , et al. July 11, 2	2000-07-11
Method of manufacturing aggregate of semiconductor micro-needles Grant 6,033,928 - Eriguchi , et al. March 7, 2	2000-03-07
Semiconductor manufacturing apparatus Grant 5,985,032 - Eriguchi November 16, 1	1999-11-16
MIS device, method of manufacturing the same, and method of diagnosing the same Grant 5,903,031 - Yamada , et al. May 11, 1	1999-05-11
Method of monitoring deposit in chamber, method of plasma processing, method of dry-cleaning chamber, and semiconductor manufacturing apparatus Grant 5,897,378 - Eriguchi April 27, 1	1999-04-27
Method of presuming life time of semiconductor device Grant 5,650,336 - Eriguchi , et al. July 22, 1	1997-07-22

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