Erickson; Brian D.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Erickson; Brian D..The latest application filed is for "method for testing through-silicon vias at wafer sort using electron beam deflection".

Company Profile

0.10.6

Erickson; Brian D. - Soquel CA US

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method for testing through-silicon vias at wafer sort using electron beam deflection Grant 9,903,910 - Erickson February 27, 2	2018-02-27
Method For Testing Through-Silicon Vias At Wafer Sort Using Electron Beam Deflection App 20170102428 - Erickson; Brian D.	2017-04-13
Method for testing through-silicon vias at wafer sort using electron beam deflection Grant 9,529,041 - Erickson December 27, 2	2016-12-27
Method For Testing Through-Silicon Vias At Wafer Sort Using Electron Beam Deflection App 20140125369 - Erickson; Brian D.	2014-05-08
Wireless programmable logic devices Grant 7,480,491 - Elayda, III , et al. January 20, 2	2009-01-20
Transmitting configuration data to a target programmable device after updating an intermediate programmable device Grant 7,302,562 - Jacobson , et al. November 27, 2	2007-11-27
Wireless programmable logic devices App 20050143022 - Elayda, Bernardo ; et al.	2005-06-30
Wireless programmable logic devices Grant 6,873,842 - Elayda , et al. March 29, 2	2005-03-29
System power control output circuit for programmable logic devices Grant 6,529,041 - Ng , et al. March 4, 2	2003-03-04
Wireless programmable logic devices App 20020173298 - Elayda, Bernardo ; et al.	2002-11-21
Method and apparatus for in-system programming with a status bit Grant 6,334,208 - Erickson December 25, 2	2001-12-25
Integrated circuit packaged for receiving another integrated circuit Grant 6,020,633 - Erickson February 1, 2	2000-02-01

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