loadpatents
Patent applications and USPTO patent grants for Erb; Darrell.The latest application filed is for "predicting em reliability by decoupling extrinsic and intrinsic sigma".
Patent | Date |
---|---|
Predicting EM reliability by decoupling extrinsic and intrinsic sigma Grant 7,146,588 - Marathe , et al. December 5, 2 | 2006-12-05 |
Selective nonconformal deposition for forming low dielectric insulation between certain conductive lines Grant 6,048,802 - Avanzino , et al. April 11, 2 | 2000-04-11 |
Uniform nonconformal deposition for forming low dielectric constant insulation between certain conductive lines Grant 5,837,618 - Avanzino , et al. November 17, 1 | 1998-11-17 |
Copper reservoir for reducing electromigration effects associated with a conductive via in a semiconductor device Grant 5,770,519 - Klein , et al. June 23, 1 | 1998-06-23 |
Copper pellet for reducing electromigration effects associated with a conductive via in a semiconductor device Grant 5,646,448 - Klein , et al. July 8, 1 | 1997-07-08 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.