Endoh; Hisamitsu
Patent Applications and Registrations
Patent applications and USPTO patent grants for Endoh; Hisamitsu.The latest application filed is for "fresnel zone plate and x-ray microscope using the fresnel zone plate".
- Endoh; Hisamitsu - Kusatsu JP
- Endoh; Hisamitsu - Shiga JP
- Endoh; Hisamitsu - Kusatsu-shi JP
| Patent | Date |
|---|---|
| Electron microscope and combined illumination lens Grant 7,601,957 - Endoh , et al. October 13, 2 | 2009-10-13 |
| Fresnel zone plate and x-ray microscope using the fresnel zone plate App 20090052619 - Endoh; Hisamitsu | 2009-02-26 |
| Electron Microscope and Combined Illumination Lens App 20080149833 - Endoh; Hisamitsu ; et al. | 2008-06-26 |
| Fresnel Zone Plate and X-Ray Microscope Using the Fresnel Zone Plate App 20080094710 - Endoh; Hisamitsu | 2008-04-24 |
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