Emami; Iraj

Patent Applications and Registrations

Patent applications and USPTO patent grants for Emami; Iraj.The latest application filed is for "transistor gate shape metrology using multiple data sources".

Company Profile

0.11.1

Emami; Iraj - Austin TX

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Scanner optimization for reduced across-chip performance variation through non-contact electrical metrology Grant 7,460,922 - Singh , et al. December 2, 2	2008-12-02
Transistor gate shape metrology using multiple data sources Grant 7,373,215 - Cain , et al. May 13, 2	2008-05-13
Transistor Gate Shape Metrology Using Multiple Data Sources App 20080058978 - Cain; Jason Phillip ; et al.	2008-03-06
Optimizing critical dimension uniformity utilizing a resist bake plate simulator Grant 7,334,202 - Singh , et al. February 19, 2	2008-02-19
Composite alignment mark scheme for multi-layers in lithography Grant 7,221,060 - Singh , et al. May 22, 2	2007-05-22
Real time immersion medium control using scatterometry Grant 7,158,896 - Singh , et al. January 2, 2	2007-01-02
Use of contamination-free manufacturing data in fault detection and classification as well as in run-to-run control Grant 6,560,504 - Goodwin , et al. May 6, 2	2003-05-06
Drop-in test structure and methodology for characterizing an integrated circuit process flow and topography Grant 6,452,412 - Jarvis , et al. September 17, 2	2002-09-17
Multipurpose defect test structure with switchable voltage contrast capability and method of use Grant 6,297,644 - Jarvis , et al. October 2, 2	2001-10-02
Drop-in test structure and abbreviated integrated circuit process flow for characterizing production integrated circuit process flow, topography, and equipment Grant 6,294,397 - Jarvis , et al. September 25, 2	2001-09-25
Semiconductor test structure with intentional partial defects and method of use Grant 6,268,717 - Jarvis , et al. July 31, 2	2001-07-31
Fractal filter applied to a contamination-free manufacturing signal to improve signal-to-noise ratios Grant 6,242,273 - Goodwin , et al. June 5, 2	2001-06-05

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