| Patent | Date |
|---|
Automated validation and calibration portable test systems and methods
Grant 10,701,571 - Doshi , et al. | 2020-06-30 |
Automated configurable portable test systems and methods
Grant 10,681,570 - Doshi , et al. | 2020-06-09 |
Local portable test systems and methods
Grant 10,548,033 - Doshi , et al. Ja | 2020-01-28 |
Cloud-based services for management of cell-based test systems
Grant 10,251,079 - Doshi , et al. | 2019-04-02 |
Device profile-driven automation for cell-based test systems
Grant 10,158,552 - Doshi , et al. Dec | 2018-12-18 |
Local Portable Test Systems And Methods
App 20180049052 - Doshi; Dinesh ; et al. | 2018-02-15 |
Cloud-based Services For Management Of Cell-based Test Systems
App 20180049054 - Doshi; Dinesh ; et al. | 2018-02-15 |
Automated Validation And Calibration Portable Test Systems And Methods
App 20180049050 - Doshi; Dinesh ; et al. | 2018-02-15 |
Device Profile-driven Automation For Cell-based Test Systems
App 20180048555 - Doshi; Dinesh ; et al. | 2018-02-15 |
Automated Configurable Portable Test Systems And Methods
App 20180049051 - Doshi; Dinesh ; et al. | 2018-02-15 |
Automated generation of a test class pre-header from an interactive graphical user interface
Grant 9,785,526 - Elston , et al. October 10, 2 | 2017-10-10 |
Implementing edit and update functionality within a development environment used to compile test plans for automated semiconductor device testing
Grant 9,785,542 - Elston , et al. October 10, 2 | 2017-10-10 |
Using shared pins in a concurrent test execution environment
Grant 9,274,911 - Elston , et al. March 1, 2 | 2016-03-01 |
Automated Generation Of A Test Class Pre-header From An Interactive Graphical User Interface
App 20140324378 - ELSTON; Mark ; et al. | 2014-10-30 |
Implementing Edit And Update Functionality Within A Development Environment Used To Compile Test Plans For Automated Semiconductor Device Testing
App 20140310693 - ELSTON; Mark ; et al. | 2014-10-16 |
Method and structure to develop a test program for semiconductor integrated circuits
Grant 8,255,198 - Krishnaswamy , et al. August 28, 2 | 2012-08-28 |
Compact representation of vendor hardware module revisions in an open architecture test system
Grant 8,214,800 - Pramanick , et al. July 3, 2 | 2012-07-03 |
Method and system for performing installation and configuration management of tester instrument modules
Grant 8,082,541 - Pramanick , et al. December 20, 2 | 2011-12-20 |
Method and Structure to Develop a Test Program for Semiconductor Integrated Circuits
App 20100192135 - KRISHNASWAMY; Ramachandran ; et al. | 2010-07-29 |
Method and system for scheduling tests in a parallel test system
Grant 7,543,200 - Pramanick , et al. June 2, 2 | 2009-06-02 |
Method and apparatus for testing integrated circuits
Grant 7,437,261 - Pramanick , et al. October 14, 2 | 2008-10-14 |
Datalog support in a modular test system
Grant 7,430,486 - Elston , et al. September 30, 2 | 2008-09-30 |
Test Emulator, Test Module Emulator And Record Medium Storing Program Therein
App 20080016396 - Higashi; Shinsaku ; et al. | 2008-01-17 |
Test Emulator, Test Module Emulator And Record Medium Storing Program Therein
App 20080010524 - Higashi; Shinsaku ; et al. | 2008-01-10 |
Method and structure to develop a test program for semiconductor integrated circuits
Grant 7,209,851 - Singh , et al. April 24, 2 | 2007-04-24 |
Method and system for simulating a modular test system
Grant 7,210,087 - Mukai , et al. April 24, 2 | 2007-04-24 |
Supporting calibration and diagnostics in an open architecture test system
Grant 7,197,416 - Adachi , et al. March 27, 2 | 2007-03-27 |
Method and structure to develop a test program for semiconductor integrated circuits
Grant 7,197,417 - Pramanick , et al. March 27, 2 | 2007-03-27 |
Method and system for controlling interchangeable components in a modular test system
Grant 7,184,917 - Pramanick , et al. February 27, 2 | 2007-02-27 |
Compact representation of vendor hardware module revisions in an open architecture test system
App 20060200816 - Pramanick; Ankan ; et al. | 2006-09-07 |
Method and system for scheduling tests in a parallel test system
App 20060195747 - Pramanick; Ankan ; et al. | 2006-08-31 |
Method and system for performing installation and configuration management of tester instrument modules
App 20060130041 - Pramanick; Ankan ; et al. | 2006-06-15 |
Supporting calibration and diagnostics in an open architecture test system
App 20050261855 - Adachi, Toshiaki ; et al. | 2005-11-24 |
Method and system for simulating a modular test system
App 20050262412 - Mukai, Conrad ; et al. | 2005-11-24 |
Datalog support in a modular test system
App 20050262414 - Elston, Mark ; et al. | 2005-11-24 |
Method and structure to develop a test program for semiconductor integrated circuits
App 20050154550 - Singh, Harsanjeet ; et al. | 2005-07-14 |
Method and structure to develop a test program for semiconductor integrated circuits
App 20050154551 - Pramanick, Ankan ; et al. | 2005-07-14 |
Test emulator, test module emulator, and record medium storing program therein
App 20050039079 - Higashi, Shinsaku ; et al. | 2005-02-17 |
Method and system for controlling interchangeable components in a modular test system
App 20050022087 - Pramanick, Ankan ; et al. | 2005-01-27 |
Method and apparatus for testing integrated circuits
App 20040225465 - Pramanick, Ankan ; et al. | 2004-11-11 |
Method and structure to develop a test program for semiconductor integrated circuits
App 20040225459 - Krishnaswamy, Ramachandran ; et al. | 2004-11-11 |
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