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Patent applications and USPTO patent grants for Elmer; James R. B..The latest application filed is for "self-aligned cell integration scheme".
Patent | Date |
---|---|
Self-aligned cell integration scheme Grant 7,915,122 - Carter , et al. March 29, 2 | 2011-03-29 |
Self-aligned cell integration scheme App 20060281256 - Carter; Richard J. ;   et al. | 2006-12-14 |
Integrated circuit process monitoring and metrology system Grant 7,115,425 - Burke , et al. October 3, 2 | 2006-10-03 |
Process independent alignment marks Grant 7,095,483 - Daniel , et al. August 22, 2 | 2006-08-22 |
Reticle overlay correction Grant 7,016,041 - Yates , et al. March 21, 2 | 2006-03-21 |
Integrated circuit process monitoring and metrology system Grant 6,964,924 - Burke , et al. November 15, 2 | 2005-11-15 |
Integrated circuit process monitoring and metrology system App 20050181615 - Burke, Peter A. ;   et al. | 2005-08-18 |
Process independent alignment marks App 20050078289 - Daniel, David W. ;   et al. | 2005-04-14 |
Plasma removal of high k metal oxide App 20050064716 - Lin, Hong ;   et al. | 2005-03-24 |
Process independent alignment marks Grant 6,856,029 - Daniel , et al. February 15, 2 | 2005-02-15 |
Selective high k dielectrics removal Grant 6,818,516 - Lo , et al. November 16, 2 | 2004-11-16 |
Multi pattern reticle Grant 6,710,851 - Elmer , et al. March 23, 2 | 2004-03-23 |
Reticle overlay correction App 20040046961 - Yates, Colin D. ;   et al. | 2004-03-11 |
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