Elmaliach; Nissim
Patent Applications and Registrations
Patent applications and USPTO patent grants for Elmaliach; Nissim.The latest application filed is for "multi-spot collection optics".
- Elmaliach; Nissim - Raanana N/A IL
- Elmaliach; Nissim - St. Raanana IL
| Patent | Date |
|---|---|
| Multi-spot collection optics Grant 9,702,983 - Eder , et al. July 11, 2 | 2017-07-11 |
| Multi-spot Collection Optics App 20140197322 - Eder; Haim ; et al. | 2014-07-17 |
| Spot grid array scanning system Grant 7,468,506 - Rogers , et al. December 23, 2 | 2008-12-23 |
| Optical spot grid array scanning system Grant 7,468,507 - Rogers , et al. December 23, 2 | 2008-12-23 |
| Optical spot grid array scanning system App 20070133077 - Rogers; Steven R. ; et al. | 2007-06-14 |
| Spot grid array scanning system App 20060261261 - Rogers; Steven R. ; et al. | 2006-11-23 |
| Wafer defect detection system with traveling lens multi-beam scanner Grant 7,053,395 - Feldman , et al. May 30, 2 | 2006-05-30 |
| Wafer defect detection system with traveling lens multi-beam scanner Grant 6,853,475 - Feldman , et al. February 8, 2 | 2005-02-08 |
| Wafer defect detection system with traveling lens multi-beam scanner Grant 6,809,808 - Feldman , et al. October 26, 2 | 2004-10-26 |
| Wafer defect detection system with traveling lens multi-beam scanner App 20040080740 - Feldman, Haim ; et al. | 2004-04-29 |
| Wafer defect detection system with traveling lens multi-beam scanner App 20040075068 - Feldman, Haim ; et al. | 2004-04-22 |
| Wafer defect detection system with traveling lens multi-beam scanner App 20030179369 - Feldman, Haim ; et al. | 2003-09-25 |
| Data converter apparatus and method particularly useful for a database-to-object inspection system Grant 6,366,687 - Aloni , et al. April 2, 2 | 2002-04-02 |
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