ELITE SEMICONDUCTOR INC.

Patent Applications and Registrations

Patent applications and USPTO patent grants for ELITE SEMICONDUCTOR INC..The latest application filed is for "smart defect calibration system in semiconductor wafer manufacturing".

Company Profile

9.11.11

ELITE SEMICONDUCTOR INC. - Zhudong Town TW
ELITE SEMICONDUCTOR INC. - Hsinchu N/A TW
ELITE SEMICONDUCTOR INC. - Hsinchu County N/A TW

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Trademarks

Patent Activity

Patent	Date
Smart Coordinate Conversion And Calibration System In Semiconductor Wafer Manufacturing App 20210231582 - LEU; Iyun ; et al.	2021-07-29
Method For Smart Conversion And Calibration Of Coordinate App 20210231580 - LEU; IYUN ; et al.	2021-07-29
Smart Defect Calibration System In Semiconductor Wafer Manufacturing App 20210231584 - LEU; IYUN ; et al.	2021-07-29
Method For Smart Conversion And Calibration Of Coordinate App 20210231579 - LEU; IYUN ; et al.	2021-07-29
Method For Performing Smart Semiconductor Wafer Defect Calibration App 20210231581 - LEU; IYUN ; et al.	2021-07-29
Smart Coordinate Conversion And Calibration System In Semiconductor Wafer Manufacturing App 20210231583 - LEU; IYUN ; et al.	2021-07-29
Smart defect calibration system and the method thereof Grant 11,016,035 - Leu May 25, 2	2021-05-25
Semiconductor Fab's defect operating system and method thereof Grant 10,726,192 - Leu , et al.	2020-07-28
Method and system for quickly diagnosing, classifying, and sampling in-line defects based on CAA pre-diagnosis database Grant 10,719,655 - Leu	2020-07-21
Semiconductor Fab's Defect Operating System And Method Thereof App 20200026819 - LEU; Iyun ; et al.	2020-01-23
Intelligent CAA failure pre-diagnosis method and system for design layout Grant 10,409,924 - Leu Sept	2019-09-10
Method and system for intelligent weak pattern diagnosis, and non-transitory computer-readable storage medium Grant 10,312,164 - Leu	2019-06-04
Smart Defect Calibration System And The Method Thereof App 20190086340 - LEU; IYUN	2019-03-21
Method and system for intelligent defect classification and sampling, and non-transitory computer-readable storage device Grant 10,228,421 - Leu	2019-03-12
Method And System For Quickly Diagnosing, Classifying, And Sampling In-line Defects Based On Caa Pre-diagnosis Database App 20190026419 - LEU; IYUN	2019-01-24
Intelligent Caa Failure Pre-diagnosis Method And System For Design Layout App 20180293334 - LEU; IYUN	2018-10-11
Method And System For Intelligent Defect Classification And Sampling, And Non-transitory Computer-readable Storage Device App 20170212168 - LEU; IYUN	2017-07-27

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