Elakkumanan; Praveen

Patent Applications and Registrations

Patent applications and USPTO patent grants for Elakkumanan; Praveen.The latest application filed is for "methods and system for analysis and management of parametric yield".

Company Profile

0.10.8

Elakkumanan; Praveen - White Plains NY
Elakkumanan; Praveen - Hopewell Junction NY
Elakkumanan; Praveen - Hartsdale NY

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Methods and system for analysis and management of parametric yield Grant 8,997,028 - Culp , et al. March 31, 2	2015-03-31
Methods And System For Analysis And Management Of Parametric Yield App 20130238263 - Culp; James A. ; et al.	2013-09-12
Methods and system for analysis and management of parametric yield Grant 8,429,576 - Culp , et al. April 23, 2	2013-04-23
Analyzing multiple induced systematic and statistical layout dependent effects on circuit performance Grant 8,418,087 - Banerjee , et al. April 9, 2	2013-04-09
Methods And System For Analysis And Management Of Parametric Yield App 20120227019 - Culp; James A. ; et al.	2012-09-06
Methods and system for analysis and management of parametric yield Grant 8,239,790 - Culp , et al. August 7, 2	2012-08-07
Analyzing Multiple Induced Systematic And Statistical Layout Dependent Effects On Circuit Performance App 20120144356 - Banerjee; Shayak ; et al.	2012-06-07
Analyzing multiple induced systematic and statistical layout dependent effects on circuit performance Grant 8,176,444 - Banerjee , et al. May 8, 2	2012-05-08
Electrically-driven optical proximity correction to compensate for non-optical effects Grant 8,103,983 - Agarwal , et al. January 24, 2	2012-01-24
Methods And System For Analysis And Management Of Parametric Yield App 20110307846 - Culp; James A. ; et al.	2011-12-15
Methods and system for analysis and management of parametric yield Grant 8,042,070 - Culp , et al. October 18, 2	2011-10-18
Electrically driven optical proximity correction Grant 7,865,864 - Banerjee , et al. January 4, 2	2011-01-04
Analyzing Multiple Induced Systematic and Statistical Layout Dependent Effects On Circuit Performance App 20100269079 - Banerjee; Shayak ; et al.	2010-10-21
Electrically-driven Optical Proximity Correction To Compensate For Non-optical Effects App 20100122231 - Agarwal; Kanak B. ; et al.	2010-05-13
Electrically Driven Optical Proximity Correction App 20090199151 - Banerjee; Shayak ; et al.	2009-08-06
Methods And System For Analysis And Management Of Parametric Yield App 20090106714 - Culp; James A. ; et al.	2009-04-23

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.