EL-MUL TECHNOLOGIES LTD
Patent Applications and Registrations
Patent applications and USPTO patent grants for EL-MUL TECHNOLOGIES LTD.The latest application filed is for "charged particle detection system".
- EL-MUL TECHNOLOGIES LTD - Rehovot IL
- EL-MUL TECHNOLOGIES LTD. - Rehovot N/A IL
- El-Mul Technologies Ltd. - Tamar Science Park Rehovot IL
- El-Mul Technologies, Ltd. - Yavne IL
- EL-Mul Technologies Ltd - Yavne IL
- El-Mul Technologies, Ltd. - Soreq Yavne IL
| Patent | Date |
|---|---|
| Charged particle detection system Grant 11,322,333 - Shur , et al. May 3, 2 | 2022-05-03 |
| Charged particle detection system Grant 11,031,210 - Shur , et al. June 8, 2 | 2021-06-08 |
| Particle detection assembly, system and method Grant 10,910,193 - Cheifetz , et al. February 2, 2 | 2021-02-02 |
| Charged Particle Detection System App 20200312609 - SHUR; Dmitry ; et al. | 2020-10-01 |
| Magnetic Photomultiplier Tube App 20200264042 - SHOFMAN; Semyon ; et al. | 2020-08-20 |
| Particle Detection Assembly, System And Method App 20190259571 - CHEIFETZ; ELI ; et al. | 2019-08-22 |
| Detection assembly, system and method Grant 10,236,155 - Cheifetz , et al. | 2019-03-19 |
| Electron detection system Grant 9,673,019 - Cheifetz , et al. June 6, 2 | 2017-06-06 |
| Detection Assembly, System And Method App 20170069459 - CHEIFETZ; ELI ; et al. | 2017-03-09 |
| Electron Detection System App 20160086765 - CHEIFETZ; ELI ; et al. | 2016-03-24 |
| Position sensitive STEM detector Grant 9,076,632 - Reinhorn , et al. July 7, 2 | 2015-07-07 |
| Position Sensitive Stem Detector App 20150034822 - Reinhorn; Silviu ; et al. | 2015-02-05 |
| Charged particle detection system and method Grant 8,222,600 - Zarchin , et al. July 17, 2 | 2012-07-17 |
| High-speed, true random-number generator Grant 7,930,333 - Vartsky , et al. April 19, 2 | 2011-04-19 |
| Three modes particle detector Grant 7,847,268 - Shofman , et al. December 7, 2 | 2010-12-07 |
| Ion detection method and apparatus with scanning electron beam App 20090309021 - Schon; Armin ; et al. | 2009-12-17 |
| Three modes particle detector App 20090294687 - Shofman; Semyon ; et al. | 2009-12-03 |
| Particle detector for secondary ions and direct and or indirect secondary electrons Grant 7,417,235 - Schon , et al. August 26, 2 | 2008-08-26 |
| Device and method for the examination of samples in a non vacuum environment using a scanning electron microscope Grant 7,253,418 - Moses , et al. August 7, 2 | 2007-08-07 |
| E.times.B ion detector for high efficiency time-of-flight mass spectrometers Grant 7,180,060 - Chefetz , et al. February 20, 2 | 2007-02-20 |
| Particle detector for secondary ions and direct and or indirect secondary electrons App 20060289748 - Schon; Armin ; et al. | 2006-12-28 |
| Device and method for the examination of samples in a non-vacuum environment using a scanning electron microscope Grant 6,992,300 - Moses , et al. January 31, 2 | 2006-01-31 |
| Device and method for the examination of samples in a non vacuum environment using a scanning electron microscope Grant 6,989,542 - Moses , et al. January 24, 2 | 2006-01-24 |
| E x B ion detector for high efficiency time-of-flight mass spectrometers App 20050056779 - Chefetz, Eli ; et al. | 2005-03-17 |
| Nanotube-based electron emission device and systems using the same Grant 6,512,235 - Eitan , et al. January 28, 2 | 2003-01-28 |
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