Eisenbach; Shlomo
Patent Applications and Registrations
Patent applications and USPTO patent grants for Eisenbach; Shlomo.The latest application filed is for "optical metrology utilizing short-wave infrared wavelengths".
- Eisenbach; Shlomo - Milpitas CA
- Eisenbach; Shlomo - Migdal HaEmek IL
- Eisenbach, Shlomo - Kfar-Pines IL
| Patent | Date |
|---|---|
| Optical Metrology Utilizing Short-wave Infrared Wavelengths App 20220291143 - Manassen; Amnon ; et al. | 2022-09-15 |
| Off-axis illumination overlay measurement using two-diffracted orders imaging Grant 11,281,111 - Shalibo , et al. March 22, 2 | 2022-03-22 |
| Off-axis Illumination Overlay Measurement Using Two-diffracted Orders Imaging App 20200132446 - Shalibo; Yoni ; et al. | 2020-04-30 |
| Shear inducing beamsplitter for interferometric image processing App 20050157313 - Mendlovic, David ; et al. | 2005-07-21 |
| Shear inducing beamsplitter for interferometric image processing Grant 6,879,427 - Mendlovic , et al. April 12, 2 | 2005-04-12 |
| Shear processor App 20030169505 - Mendlovic, David ; et al. | 2003-09-11 |
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