Eguchi; Richard K.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Eguchi; Richard K..The latest application filed is for "method and apparatus for stressing a non-volatile memory".

Company Profile

2.48.40

Eguchi; Richard K. - Austin TX

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method and apparatus for stressing a non-volatile memory Grant 10,109,356 - He , et al. October 23, 2	2018-10-23
Non-volatile memory (NVM) with endurance control Grant 9,508,397 - Eguchi , et al. November 29, 2	2016-11-29
Method And Apparatus For Stressing A Non-volatile Memory App 20160247574 - HE; CHEN ; et al.	2016-08-25
Imminent read failure detection based upon changes in error voltage windows for NVM cells Grant 9,329,933 - Weilemann, II , et al. May 3, 2	2016-05-03
Imminent read failure detection using high/low read voltage levels Grant 9,329,921 - Weilemann, II , et al. May 3, 2	2016-05-03
Imminent read failure detection based upon unacceptable wear for NVM cells Grant 9,329,932 - Weilemann, II , et al. May 3, 2	2016-05-03
Robust memory start-up using clock counter Grant 9,318,163 - Eguchi , et al. April 19, 2	2016-04-19
Non-volatile memory robust start-up using analog-to-digital converter Grant 9,318,161 - Eguchi , et al. April 19, 2	2016-04-19
Temperature-based adaptive erase or program parallelism Grant 9,224,478 - Eguchi , et al. December 29, 2	2015-12-29
Imminent Read Failure Detection Based Upon Unacceptable Wear For NVM Cells App 20150309857 - Weilemann, II; Jon W. ; et al.	2015-10-29
Imminent Read Failure Detection Using High/Low Read Voltage Levels App 20150309856 - Weilemann, II; Jon W. ; et al.	2015-10-29
Imminent Read Failure Detection Based Upon Changes In Error Voltage Windows For NVM Cells App 20150309858 - Weilemann, II; Jon W. ; et al.	2015-10-29
Non-volatile memory (NVM) with adaptive write operations Grant 9,082,510 - He , et al. July 14, 2	2015-07-14
Built-in self trim for non-volatile memory reference current Grant 9,076,508 - He , et al. July 7, 2	2015-07-07
Stress-based techniques for detecting an imminent read failure in a non-volatile memory array Grant 8,977,914 - Eguchi , et al. March 10, 2	2015-03-10
Methods and systems for adjusting NVM cell bias conditions for program/erase operations to reduce performance degradation Grant 8,902,667 - Mu , et al. December 2, 2	2014-12-02
Temperature-Based Adaptive Erase or Program Parallelism App 20140254285 - Eguchi; Richard K. ; et al.	2014-09-11
Robust Memory Start-up Using Clock Counter App 20140254299 - Eguchi; Richard K. ; et al.	2014-09-11
Non-volatile memory (NVM) with imminent error prediction Grant 8,782,478 - Eguchi , et al. July 15, 2	2014-07-15
Built-in Self Trim For Non-volatile Memory Reference Current App 20140160869 - HE; CHEN ; et al.	2014-06-12
Non-volatile Memory Robust Start-up Using Analog-to-digital Converter App 20140140161 - Eguchi; Richard K. ; et al.	2014-05-22
Built-in self trim for non-volatile memory reference current Grant 8,687,428 - He , et al. April 1, 2	2014-04-01
Non-volatile Memory (nvm) With Adaptive Write Operations App 20140078829 - HE; CHEN ; et al.	2014-03-20
Non-Volatile Memory (NVM) with Imminent Error Prediction App 20140040687 - Eguchi; Richard K. ; et al.	2014-02-06
Methods And Systems For Adjusting Nvm Cell Bias Conditions For Program/erase Operations To Reduce Performance Degradation App 20140029351 - Mu; Fuchen ; et al.	2014-01-30
Stress-based Techniques For Detecting An Imminent Read Failure In A Non-volatile Memory Array App 20130326285 - Eguchi; Richard K. ; et al.	2013-12-05
Non-volatile memory (NVM) with imminent error prediction Grant 8,572,445 - Eguchi , et al. October 29, 2	2013-10-29
Method and apparatus for EEPROM emulation for preventing data loss in the event of a flash block failure Grant 8,516,213 - He , et al. August 20, 2	2013-08-20
Adaptive write procedures for non-volatile memory Grant 8,509,001 - He , et al. August 13, 2	2013-08-13
Threshold voltage techniques for detecting an imminent read failure in a memory array Grant 8,504,884 - Eguchi , et al. August 6, 2	2013-08-06
Built-in Self Trim For Non-volatile Memory Reference Current App 20130107621 - He; Chen ; et al.	2013-05-02
Adaptive write procedures for non-volatile memory using verify read Grant 8,432,752 - Eguchi , et al. April 30, 2	2013-04-30
Digital method to obtain the I-V curves of NVM bitcells Grant 8,427,877 - He , et al. April 23, 2	2013-04-23
Adaptive Write Procedures For Non-volatile Memory App 20120327710 - HE; CHEN ; et al.	2012-12-27
Adaptive Write Procedures For Non-volatile Memory Using Verify Read App 20120327720 - Eguchi; Richard K. ; et al.	2012-12-27
Non-volatile memory (NVM) erase operation with brownout recovery technique Grant 8,289,773 - Eguchi , et al. October 16, 2	2012-10-16
Digital Method to Obtain the I-V Curves of NVM Bitcells App 20120206973 - He; Chen ; et al.	2012-08-16
Method and Apparatus for EEPROM Emulation for Preventing Data Loss in the Event of a Flash Block Failure App 20120131262 - He; Chen ; et al.	2012-05-24
Non-volatile Memory (nvm) Erase Operation With Brownout Recovery Technique App 20120117307 - EGUCHI; RICHARD K. ; et al.	2012-05-10
Non-volatile Memory (nvm) With Imminent Error Prediction App 20120072794 - EGUCHI; RICHARD K. ; et al.	2012-03-22
Time-based techniques for detecting an imminent read failure in a memory array Grant 8,095,836 - Eguchi , et al. January 10, 2	2012-01-10
Memory device with adjustable read reference based on ECC and method thereof Grant 7,865,797 - Eguchi , et al. January 4, 2	2011-01-04
Method for electrically trimming an NVM reference cell Grant 7,782,664 - Gasquet , et al. August 24, 2	2010-08-24
Non-volatile memory having a dynamically adjustable soft program verify voltage level and method therefor Grant 7,649,782 - Eguchi , et al. January 19, 2	2010-01-19
Non-volatile memory having a multiple block erase mode and method therefor Grant 7,640,389 - Eguchi , et al. December 29, 2	2009-12-29
Method For Electrically Trimming An Nvm Reference Cell App 20090296464 - Gasquet; Horacio P. ; et al.	2009-12-03
In-circuit Vt distribution bit counter for non-volatile memory devices Grant 7,599,236 - Eguchi , et al. October 6, 2	2009-10-06
Electrical Erasable Programmable Memory Transconductance Testing App 20090168541 - Eguchi; Richard K. ; et al.	2009-07-02
Electrical erasable programmable memory transconductance testing Grant 7,545,679 - Eguchi , et al. June 9, 2	2009-06-09
Non-volatile Memory Having A Dynamically Adjustable Soft Program Verify Voltage Level And Method Therefor App 20090034339 - Eguchi; Richard K. ; et al.	2009-02-05
Memory Device With Adjustable Read Reference Based On Ecc And Method Thereof App 20080120526 - Eguchi; Richard K. ; et al.	2008-05-22
In-circuit Vt distribution bit counter for non-volatile memory devices App 20070285986 - Eguchi; Richard K. ; et al.	2007-12-13
Non-volatile memory having a multiple block erase mode and method therefor App 20070204098 - Eguchi; Richard K. ; et al.	2007-08-30
Integrated circuit with test pad structure and method of testing Grant 6,937,047 - Tran , et al. August 30, 2	2005-08-30
Integrated circuit with test pad structure and method of testing App 20050030055 - Tran, Tu-Anh ; et al.	2005-02-10
Auto-tuneable reference circuit for flash EEPROM products Grant 6,826,103 - Moon , et al. November 30, 2	2004-11-30
Self-repair of memory arrays using preallocated redundancy (PAR) architecture App 20040123181 - Moon, Nathan I. ; et al.	2004-06-24
Auto-tuneable reference circuit for flash eeprom products App 20040085843 - Moon, Nathan I. ; et al.	2004-05-06

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