loadpatents
Patent applications and USPTO patent grants for Eckelman; Joseph E..The latest application filed is for "analog testing of ring oscillators using built-in self test apparatus".
Patent | Date |
---|---|
Analog testing of ring oscillators using built-in self test apparatus Grant 7,765,445 - Eckelman , et al. July 27, 2 | 2010-07-27 |
Analog Testing of Ring Oscillators Using Built-In Self Test Apparatus App 20090210760 - Eckelman; Joseph E. ;   et al. | 2009-08-20 |
Method for at speed testing of multi-clock domain chips App 20060195288 - McNamara; Timothy G. ;   et al. | 2006-08-31 |
Method and apparatus for ABIST diagnostics Grant 7,076,706 - Eckelman , et al. July 11, 2 | 2006-07-11 |
Method and system for determining repeatable yield detractors of integrated circuits Grant 6,751,765 - Rizzolo , et al. June 15, 2 | 2004-06-15 |
Method and apparatus for ABIST diagnostics App 20020157051 - Eckelman, Joseph E. ;   et al. | 2002-10-24 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.