EBARA; Koji

Patent Applications and Registrations

Patent applications and USPTO patent grants for EBARA; Koji.The latest application filed is for "method for measuring resistivity of silicon single crystal".

Company Profile

0.8.16

EBARA; Koji - Annaka-shi JP
Ebara; Koji - Annaka JP
Ebara; Koji - Chiba JP
Ebara; Koji - Gunma JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method For Measuring Resistivity Of Silicon Single Crystal App 20220146444 - KUME; Fumitaka ; et al.	2022-05-12
Method for manufacturing silicon wafer Grant 10,297,463 - Suzuki , et al.	2019-05-21
Method For Manufacturing Silicon Wafer App 20180247830 - SUZUKI; Katsuyoshi ; et al.	2018-08-30
Method for manufacturing silicon substrate and silicon substrate Grant 9,390,905 - Oka , et al. July 12, 2	2016-07-12
Method for manufacturing silicon single crystal wafer and electronic device Grant 9,252,025 - Oka , et al. February 2, 2	2016-02-02
Method For Manufacturing Silicon Single Crystal Wafer And Electronic Device App 20150001680 - Oka; Tetsuya ; et al.	2015-01-01
Method For Manufacturing Silicon Substrate And Silicon Substrate App 20130316139 - Oka; Tetsuya ; et al.	2013-11-28
Method For Heat-treating Wafer, Method For Producing Silicon Wafer, Silicon Wafer, And Heat Treatment Apparatus App 20130098888 - Ebara; Koji ; et al.	2013-04-25
Method For Producing Silicon Wafer And Silicon Wafer App 20130093060 - Oka; Tetsuya ; et al.	2013-04-18
Method for manufacturing silicon wafer and silicon wafer manufactured by this method Grant 8,377,202 - Ebara February 19, 2	2013-02-19
Annealed Wafer, Method For Producing Annealed Wafer And Method For Fabricating Device App 20120001301 - Ebara; Koji ; et al.	2012-01-05
Silicon Single Crystal Wafer, Method For Producing Silicon Single Crystal Or Method For Producing Silicon Single Crystal Wafer, And Semiconductor Device App 20110001219 - Ebara; Koji ; et al.	2011-01-06
Time recorder Grant 7,839,426 - Ebara November 23, 2	2010-11-23
Method for Manufacturing Silicon Wafer and Silicon Wafer Manufactured by this Method App 20090242843 - Ebara; Koji	2009-10-01
Time Recorder App 20090109249 - EBARA; Koji	2009-04-30
Method for Manufacturing Silicon Single Crystal Wafer App 20090007839 - Ebara; Koji	2009-01-08
Method For Manufacturing Silicon Single Crystal Wafer App 20090000535 - Ebara; Koji	2009-01-01
Method for measuring resistivity of semiconductor wafer Grant 6,914,442 - Ebara July 5, 2	2005-07-05
Method for measuring resistivity of semiconductor wafer App 20040212377 - Ebara, Koji	2004-10-28

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