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name:-0.23908185958862
name:-0.020145893096924
name:-0.0006098747253418
Dziech; Michael Leonard Patent Filings

Dziech; Michael Leonard

Patent Applications and Registrations

Patent applications and USPTO patent grants for Dziech; Michael Leonard.The latest application filed is for "method and apparatus for inspecting a component".

Company Profile
0.5.3
  • Dziech; Michael Leonard - Cincinnati OH
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Method and apparatus for inspecting a component
Grant 7,313,961 - Tenley , et al. January 1, 2
2008-01-01
Methods and apparatus for inspecting a component
Grant 7,190,162 - Tenley , et al. March 13, 2
2007-03-13
Method and apparatus for inspecting a component
App 20060236769 - Tenley; Brenda Catherine ;   et al.
2006-10-26
Methods and apparatus for inspecting a component
App 20060017434 - Tenley; Brenda Catherine ;   et al.
2006-01-26
Internal eddy current inspection
Grant 6,972,561 - Fields , et al. December 6, 2
2005-12-06
Self-aligning probe and its use
Grant 6,894,492 - Dziech May 17, 2
2005-05-17
Internal eddy current inspection
App 20040169510 - Fields, Michael Wayne ;   et al.
2004-09-02
Rotor slot bottom inspection apparatus and method
Grant 6,608,478 - Dziech , et al. August 19, 2
2003-08-19

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