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Patent applications and USPTO patent grants for Dziech; Michael Leonard.The latest application filed is for "method and apparatus for inspecting a component".
Patent | Date |
---|---|
Method and apparatus for inspecting a component Grant 7,313,961 - Tenley , et al. January 1, 2 | 2008-01-01 |
Methods and apparatus for inspecting a component Grant 7,190,162 - Tenley , et al. March 13, 2 | 2007-03-13 |
Method and apparatus for inspecting a component App 20060236769 - Tenley; Brenda Catherine ;   et al. | 2006-10-26 |
Methods and apparatus for inspecting a component App 20060017434 - Tenley; Brenda Catherine ;   et al. | 2006-01-26 |
Internal eddy current inspection Grant 6,972,561 - Fields , et al. December 6, 2 | 2005-12-06 |
Self-aligning probe and its use Grant 6,894,492 - Dziech May 17, 2 | 2005-05-17 |
Internal eddy current inspection App 20040169510 - Fields, Michael Wayne ;   et al. | 2004-09-02 |
Rotor slot bottom inspection apparatus and method Grant 6,608,478 - Dziech , et al. August 19, 2 | 2003-08-19 |
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