Duval; Paul J.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Duval; Paul J..The latest application filed is for "ohmic alloy contact region sealing layer".

Company Profile

2.13.11

Duval; Paul J. - Lexington MA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Ohmic alloy contact region sealing layer Grant 11,145,735 - Duval , et al. October 12, 2	2021-10-12
Ohmic Alloy Contact Region Sealing Layer App 20210111263 - Duval; Paul J. ; et al.	2021-04-15
Field Effect Transistor Having Improved Gate Structures App 20210098285 - LaRoche; Jeffrey R. ; et al.	2021-04-01
Patterned wafer solder diffusion barrier Grant 10,861,792 - Duval December 8, 2	2020-12-08
Patterned Wafer Solder Diffusion Barrier App 20200312776 - Duval; Paul J.	2020-10-01
Air bridge structure having dielectric coating Grant 9,362,237 - Fillmore , et al. June 7, 2	2016-06-07
Photolithographic, thickness non-uniformity, compensation features for optical photolithographic semiconductor structure formation Grant 9,343,328 - Duval , et al. May 17, 2	2016-05-17
Air Bridge Structure Having Dielectric Coating App 20160071809 - Fillmore; Ward G. ; et al.	2016-03-10
Air bridge structure having dielectric coating Grant 9,219,024 - Fillmore , et al. December 22, 2	2015-12-22
Method for processing semiconductors using a combination of electron beam and optical lithography Grant 9,219,000 - Duval , et al. December 22, 2	2015-12-22
Air Bridge Structure Having Dielectric Coating App 20150137310 - Fillmore; Ward G. ; et al.	2015-05-21
Photolithographic, Thickness Non-uniformity, Compensation Features For Optical Photolithographic Semiconductor Structure Formation App 20150111379 - Duval; Paul J. ; et al.	2015-04-23
Photolithographic, Thickness Non-uniformity, Compensation Features For Optical Photolithographic Semiconductor Structure Formation App 20140319586 - Duval; Paul J. ; et al.	2014-10-30
Method For Processing Semiconductors Using A Combination Of Electron Beam And Optical Lithography App 20140206173 - Duval; Paul J. ; et al.	2014-07-24
Method for processing semiconductors using a combination of electron beam and optical lithography Grant 8,754,421 - Duval , et al. June 17, 2	2014-06-17
Method For Processing Semiconductors Using A Combination Of Electron Beam And Optical Lithography App 20130221365 - Duval; Paul J. ; et al.	2013-08-29
Beam alignment in a lower column of a scanning electron microscope or the like Grant 6,717,143 - Duval , et al. April 6, 2	2004-04-06
Fixture for assembling parts of a device such as a Wien filter Grant 6,678,932 - Duval , et al. January 20, 2	2004-01-20
Beam alignment in a lower column of a scanning electron microscope or the like App 20030201392 - Duval, Paul J. ; et al.	2003-10-30
Wien filter for use in a scanning electron microscope or the like Grant 6,593,578 - Duval , et al. July 15, 2	2003-07-15
Method for forming photoresist features having reentrant profiles using a basic agent Grant 5,955,244 - Duval September 21, 1	1999-09-21
Method of making a thin film magnetic head having multi-layer coils Grant 5,448,822 - Wu , et al. September 12, 1	1995-09-12

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