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Patent applications and USPTO patent grants for Dulman; Lev.The latest application filed is for "method and apparatus for determining sample composition with an interferometer".
Patent | Date |
---|---|
Interferometric topological metrology with pre-established reference scale Grant 7,136,168 - Dulman November 14, 2 | 2006-11-14 |
Advanced signal processing technique for translating fringe line disturbances into sample height at a particular position above an interferometer's sample stage Grant 6,999,181 - Dulman February 14, 2 | 2006-02-14 |
Interferometric topological metrology with pre-established reference scale App 20040027581 - Dulman, Lev | 2004-02-12 |
Pre-established reference scale for interferometric topological metrology App 20040027583 - Dulman, Lev | 2004-02-12 |
Method and apparatus for determining sample composition with an interferometer App 20040027582 - Dulman, Lev | 2004-02-12 |
Advanced signal processing technique for translating fringe line disturbances into sample height at a particular position above an interferometer's sample stage App 20040027584 - Dulman, Lev | 2004-02-12 |
Inteferometric imaging system Grant 4,957,367 - Dulman September 18, 1 | 1990-09-18 |
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