Duggirala; Suryanarayana

Patent Applications and Registrations

Patent applications and USPTO patent grants for Duggirala; Suryanarayana.The latest application filed is for "dynamically reconfigurable shared scan-in test architecture".

Company Profile

0.10.7

Duggirala; Suryanarayana - San Jose CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Dynamically reconfigurable shared scan-in test architecture Grant 7,900,105 - Kapur , et al. March 1, 2	2011-03-01
Dynamically reconfigurable shared scan-in test architecture Grant 7,836,368 - Kapur , et al. November 16, 2	2010-11-16
Dynamically reconfigurable shared scan-in test architecture Grant 7,836,367 - Kapur , et al. November 16, 2	2010-11-16
Dynamically Reconfigurable Shared Scan-In Test Architecture App 20100223516 - Kapur; Rohit ; et al.	2010-09-02
Dynamically reconfigurable shared scan-in test architecture Grant 7,774,663 - Kapur , et al. August 10, 2	2010-08-10
Dynamically reconfigurable shared scan-in test architecture Grant 7,743,299 - Kapur , et al. June 22, 2	2010-06-22
Dynamically Reconfigurable Shared Scan-In Test Architecture App 20100031101 - Kapur; Rohit ; et al.	2010-02-04
Dynamically Reconfigurable Shared Scan-In Test Architecture App 20090313514 - Kapur; Rohit ; et al.	2009-12-17
Dynamically Reconfigurable Shared Scan-In Test Architecture App 20090271673 - Kapur; Rohit ; et al.	2009-10-29
Dynamically reconfigurable shared scan-in test architecture Grant 7,596,733 - Kapur , et al. September 29, 2	2009-09-29
Dynamically Reconfigurable Shared Scan-In Test Architecture App 20080301510 - Kapur; Rohit ; et al.	2008-12-04
Dynamically Reconfigurable Shared Scan-In Test Architecture App 20080294955 - Kapur; Rohit ; et al.	2008-11-27
Dynamically reconfigurable shared scan-in test architecture Grant 7,418,640 - Kapur , et al. August 26, 2	2008-08-26
Dynamically reconfigurable shared scan-in test architecture App 20050268190 - Kapur, Rohit ; et al.	2005-12-01
System and method for high-level test planning for layout Grant 6,766,501 - Duggirala , et al. July 20, 2	2004-07-20
System and method for high-level test planning for layout Grant 6,434,733 - Duggirala , et al. August 13, 2	2002-08-13
Method for placement-based scan-in and scan-out ports selection Grant 6,405,355 - Duggirala , et al. June 11, 2	2002-06-11

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