Drexel; Volker

Patent Applications and Registrations

Patent applications and USPTO patent grants for Drexel; Volker.The latest application filed is for "particle source for producing a particle beam and particle-optical apparatus".

Company Profile

1.18.12

Drexel; Volker - Koenigsbronn DE
Drexel; Volker - Konigsbronn DE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Particle source for producing a particle beam and particle-optical apparatus Grant 10,446,360 - Drexel , et al. Oc	2019-10-15
Particle Source For Producing A Particle Beam And Particle-optical Apparatus App 20180330912 - Drexel; Volker ; et al.	2018-11-15
Electron beam source and method of manufacturing the same Grant 8,723,138 - Drexel , et al. May 13, 2	2014-05-13
Electron beam source and method of manufacturing the same Grant 8,536,773 - Buehler , et al. September 17, 2	2013-09-17
Electron beam device Grant 8,431,894 - Essers , et al. April 30, 2	2013-04-30
Objective lens Grant 8,362,443 - Drexel January 29, 2	2013-01-29
Electron Beam Source And Method Of Manufacturing The Same App 20120248959 - Buehler; Wolfram ; et al.	2012-10-04
Objective Lens App 20120205550 - Drexel; Volker	2012-08-16
Electron Beam Source And Method Of Manufacturing The Same App 20120131785 - Drexel; Volker ; et al.	2012-05-31
Objective lens Grant 8,178,849 - Drexel May 15, 2	2012-05-15
Electron beam source and method of manufacturing the same Grant 8,164,071 - Drexel , et al. April 24, 2	2012-04-24
Electron-beam device and detector system Grant 7,910,887 - Steigerwald , et al. March 22, 2	2011-03-22
Electron Beam Source And Method Of Manufacturing The Same App 20100078557 - Drexel; Volker ; et al.	2010-04-01
Objective Lens App 20100038538 - Drexel; Volker	2010-02-18
Electron-beam device and detector system App 20090309024 - STEIGERWALD; MICHAEL D.G. ; et al.	2009-12-17
Electron-beam device and detector system Grant 7,507,962 - Steigerwald , et al. March 24, 2	2009-03-24
Electron beam device App 20090039257 - Essers; Erik ; et al.	2009-02-12
Detector for variable pressure areas and an electron microscope comprising a corresponding detector Grant 7,462,839 - Gnauck , et al. December 9, 2	2008-12-09
Electron-beam device and detector system Grant 7,425,701 - Steigerwald , et al. September 16, 2	2008-09-16
Electron-beam device and detector system App 20070120071 - Steigerwald; Michael D.G. ; et al.	2007-05-31
Detector system for a particle beam apparatus, and particle beam apparatus with such a detector system Grant 7,060,978 - Drexel , et al. June 13, 2	2006-06-13
Detector for variable pressure areas and an electron microscope comprising a corresponding detector App 20050173644 - Gnauck, Peter ; et al.	2005-08-11
Particle beam device with a particle source to be operated in high vacuum and cascade-type pump arrangement for such a particle beam device Grant 6,872,956 - Gnauck , et al. March 29, 2	2005-03-29
Particle beam device with a particle source to be operated in high vacuum and cascade-type pump arrangement for such a particle beam device App 20040076529 - Gnauck, Peter ; et al.	2004-04-22
Particle beam device Grant 6,498,345 - Weimer , et al. December 24, 2	2002-12-24
Detector system for a particle beam apparatus, and particle beam apparatus with such a detector system App 20020011565 - Drexel, Volker ; et al.	2002-01-31

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