Drege; Emmanuel

Patent Applications and Registrations

Patent applications and USPTO patent grants for Drege; Emmanuel.The latest application filed is for "methods, systems, and computer program product for implementing hotspot detection, repair, and optimization of an electronic circuit design".

Company Profile

0.19.20

Drege; Emmanuel - Los Gatos CA US
Drege; Emmanuel - San Jose CA
Drege; Emmanuel - SanJose CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Modeling and cross correlation of design predicted criticalities for optimization of semiconductor manufacturing Grant 8,407,630 - Chan , et al. March 26, 2	2013-03-26
Methods, systems, and computer program product for implementing hotspot detection, repair, and optimization of an electronic circuit design Grant 8,302,052 - Lee , et al. October 30, 2	2012-10-30
Method and system for mask optimization Grant 8,156,450 - Chan , et al. April 10, 2	2012-04-10
Method and system for process optimization Grant 8,146,024 - Chan , et al. March 27, 2	2012-03-27
Methods, Systems, And Computer Program Product For Implementing Hotspot Detection, Repair, And Optimization Of An Electronic Circuit Design App 20100324878 - LEE; Brian ; et al.	2010-12-23
Optical metrology of structures formed on semiconductor wafers using machine learning systems Grant 7,831,528 - Doddi , et al. November 9, 2	2010-11-09
Modeling and cross correlation of design predicted criticalities for optimization of semiconductor manufacturing Grant 7,694,244 - Chan , et al. April 6, 2	2010-04-06
Methods, System, And Computer Program Prodcut For Implementing Compact Manufacturing Model In Electronic Design Automation App 20100083200 - Song; Li J. ; et al.	2010-04-01
Method and system for inspection optimization in design and production of integrated circuits Grant 7,665,048 - Chan , et al. February 16, 2	2010-02-16
Optical metrology model optimization based on goals Grant 7,588,949 - Vuong , et al. September 15, 2	2009-09-15
Optical Metrology Of Structures Formed On Semiconductor Wafers Using Machine Learning Systems App 20090198635 - Doddi; Srinivas ; et al.	2009-08-06
Selecting a profile model for use in optical metrology using a machine learning system Grant 7,523,076 - Drege , et al. April 21, 2	2009-04-21
Model and parameter selection for optical metrology Grant 7,505,153 - Vuong , et al. March 17, 2	2009-03-17
Selection of wavelengths for integrated circuit optical metrology Grant 7,474,993 - Doddi , et al. January 6, 2	2009-01-06
Selecting a hypothetical profile to use in optical metrology Grant 7,394,554 - Vuong , et al. July 1, 2	2008-07-01
Model And Parameter Selection For Optical Metrology App 20080151269 - Vuong; Vi ; et al.	2008-06-26
Method And System For Process Optimization App 20080148194 - Chan; Kevin ; et al.	2008-06-19
Method And System For Mask Optimization App 20080148216 - Chan; Kevin ; et al.	2008-06-19
Method And System For Inspection Optimization App 20080148195 - Chan; Kevin ; et al.	2008-06-19
Modeling And Cross Correlation Of Design Predicted Criticalities For Optimization Of Semiconductor Manufacturing App 20080147374 - Chan; Kevin ; et al.	2008-06-19
Model and parameter selection for optical metrology Grant 7,330,279 - Vuong , et al. February 12, 2	2008-02-12
Selection of wavelengths for integrated circuit optical metrology App 20070198211 - Doddi; Srinivas ; et al.	2007-08-23
Optical metrology model optimization based on goals App 20070135959 - Vuong; Vi ; et al.	2007-06-14
Selection of wavelengths for integrated circuit optical metrology Grant 7,216,045 - Doddi , et al. May 8, 2	2007-05-08
Optical metrology model optimization based on goals Grant 7,171,284 - Vuong , et al. January 30, 2	2007-01-30
Edge roughness measurement in optical metrology Grant 7,046,375 - Bischoff , et al. May 16, 2	2006-05-16
Optical metrology model optimization based on goals App 20060064280 - Vuong; Vi ; et al.	2006-03-23
Selecting a profile model for use in optical metrology using a machine learining system App 20050192914 - Drege, Emmanuel ; et al.	2005-09-01
Selecting a hypothetical profile to use in optical metrology App 20050057748 - Vuong, Vi ; et al.	2005-03-17
Metrology hardware adaptation with universal library Grant 6,853,942 - Drege , et al. February 8, 2	2005-02-08
Integrated circuit profile value determination Grant 6,842,261 - Bao , et al. January 11, 2	2005-01-11
Optical metrology of structures formed on semiconductor wafer using machine learning systems App 20040267397 - Doddi, Srinivas ; et al.	2004-12-30
Edge roughness measurement in optical metrology App 20040218192 - Bischoff, Joerg ; et al.	2004-11-04
Diffraction order selection for optical metrology simulation App 20040090629 - Drege, Emmanuel ; et al.	2004-05-13
Integrated circuit profile value determination App 20040039473 - Bao, Junwei ; et al.	2004-02-26
Model and parameter selection for optical metrology App 20040017574 - Vuong, Vi ; et al.	2004-01-29
Selection of wavelengths for integrated circuit optical metrology App 20030225535 - Doddi, Srinivas ; et al.	2003-12-04
Metrology hardware adaptation with universal library App 20030187604 - Drege, Emmanuel ; et al.	2003-10-02

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