Douskey; Steven M.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Douskey; Steven M..The latest application filed is for "dynamically power noise adaptive automatic test pattern generation".

Company Profile

11.66.56

Douskey; Steven M. - Rochester MN

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Operating pulsed latches on a variable power supply Grant 11,112,854 - Douskey , et al. September 7, 2	2021-09-07
Dynamically power noise adaptive automatic test pattern generation Grant 10,816,599 - Douskey , et al. October 27, 2	2020-10-27
Dynamically Power Noise Adaptive Automatic Test Pattern Generation App 20200225283 - DOUSKEY; Steven M. ; et al.	2020-07-16
Operating Pulsed Latches On A Variable Power Supply App 20190286221 - DOUSKEY; STEVEN M. ; et al.	2019-09-19
Operating pulsed latches on a variable power supply Grant 10,386,912 - Douskey , et al. A	2019-08-20
Minimization of over-masking in an on product multiple input signature register (OPMISR) Grant 10,379,159 - Douskey , et al. A	2019-08-13
Implementing enhanced diagnostics with intelligent pattern combination in automatic test pattern generation (ATPG) Grant 10,372,853 - Douskey , et al.	2019-08-06
Removal of over-masking in an on product multiple input signature register (OPMISR) test Grant 10,371,749 - Douskey , et al.	2019-08-06
Minimization of over-masking in an on product multiple input signature register (OPMISR) Grant 10,371,750 - Douskey , et al.	2019-08-06
Implementing decreased scan data interdependence for compressed patterns in on product multiple input signature register (OPMISR) through scan skewing Grant 10,359,471 - Douskey , et al.	2019-07-23
Implementing over-masking removal in an on product multiple input signature register (OPMISR) test due to common channel mask scan registers (CMSR) loading Grant 10,345,380 - Douskey , et al. July 9, 2	2019-07-09
Implementing register array (RA) repair using LBIST Grant 10,234,507 - Douskey , et al.	2019-03-19
Implementing Enhanced Diagnostics With Intelligent Pattern Combination In Automatic Test Pattern Generation (atpg) App 20180267102 - Douskey; Steven M. ; et al.	2018-09-20
Implementing Integrated Circuit Yield Enhancement Through Array Fault Detection And Correction Using Combined Abist, Lbist, And Repair Techniques App 20180259576 - Douskey; Steven M. ; et al.	2018-09-13
Portion isolation architecture for chip isolation test Grant 10,067,183 - Douskey , et al. September 4, 2	2018-09-04
Adjusting latency in a scan cell Grant 10,060,971 - Douskey , et al. August 28, 2	2018-08-28
Implementing prioritized compressed failure defects for efficient scan diagnostics Grant 10,060,978 - Douskey , et al. August 28, 2	2018-08-28
Implementing decreased scan data interdependence for compressed patterns in on product multiple input signature register (OPMISR) through spreading in stumpmux daisy-chain structure Grant 10,024,917 - Douskey , et al. July 17, 2	2018-07-17
Diagnosing failure locations of an integrated circuit with logic built-in self-test Grant 10,024,914 - Douskey , et al. July 17, 2	2018-07-17
Operating Pulsed Latches On A Variable Power Supply App 20180196497 - DOUSKEY; STEVEN M. ; et al.	2018-07-12
Adjusting latency in a scan cell Grant 10,001,523 - Douskey , et al. June 19, 2	2018-06-19
Implementing decreased scan data interdependence in on product multiple input signature register (OPMISR) through PRPG control rotation Grant 9,964,591 - Douskey , et al. May 8, 2	2018-05-08
Adjusting Latency In A Scan Cell App 20180052198 - DOUSKEY; Steven M. ; et al.	2018-02-22
Adjusting Latency In A Scan Cell App 20180052199 - DOUSKEY; Steven M. ; et al.	2018-02-22
Implementing Register Array (ra) Repair Using Lbist App 20180024189 - Douskey; Steven M. ; et al.	2018-01-25
Diagnosing Failure Locations Of An Integrated Circuit With Logic Built-in Self-test App 20180003768 - DOUSKEY; STEVEN M. ; et al.	2018-01-04
Implementing Prioritized Compressed Failure Defects For Efficient Scan Diagnostics App 20170363685 - Douskey; Steven M. ; et al.	2017-12-21
Portion Isolation Architecture For Chip Isolation Test App 20170363683 - Douskey; Steven M. ; et al.	2017-12-21
Implementing Decreased Scan Data Interdependence For Compressed Patterns In On Product Multiple Input Signature Register (opmisr) Through Scan Skewing App 20170356959 - Douskey; Steven M. ; et al.	2017-12-14
Implementing Decreased Scan Data Interdependence In On Product Multiple Input Signature Register (opmisr) Through Prpg Control Rotation App 20170299654 - Douskey; Steven M. ; et al.	2017-10-19
Collecting diagnostic data from chips Grant 9,746,516 - Douskey , et al. August 29, 2	2017-08-29
Scan chain processing in a partially functional chip Grant 9,726,723 - Douskey , et al. August 8, 2	2017-08-08
Scan chain processing in a partially functional chip Grant 9,575,120 - Douskey , et al. February 21, 2	2017-02-21
Managing redundancy repair using boundary scans Grant 9,568,549 - Douskey , et al. February 14, 2	2017-02-14
Partitioned scan chain diagnostics using multiple bypass structures and injection points Grant 9,557,383 - Douskey , et al. January 31, 2	2017-01-31
Inserting bypass structures at tap points to reduce latch dependency during scan testing Grant 9,551,747 - Douskey , et al. January 24, 2	2017-01-24
Inserting bypass structures at tap points to reduce latch dependency during scan testing Grant 9,547,039 - Douskey , et al. January 17, 2	2017-01-17
Partitioned scan chain diagnostics using multiple bypass structures and injection points Grant 9,529,046 - Douskey , et al. December 27, 2	2016-12-27
Implementing enhanced scan chain diagnostics via bypass multiplexing structure Grant 9,429,622 - Douskey , et al. August 30, 2	2016-08-30
Implementing enhanced scan chain diagnostics via bypass multiplexing structure Grant 9,429,621 - Douskey , et al. August 30, 2	2016-08-30
Collecting Diagnostic Data From Chips App 20160238656 - Douskey; Steven M. ; et al.	2016-08-18
Method and apparatus for efficient hierarchical chip testing and diagnostics with support for partially bad dies Grant 9,404,969 - Keller , et al. August 2, 2	2016-08-02
Implementing Enhanced Scan Chain Diagnostics Via Bypass Multiplexing Structure App 20160216323 - Douskey; Steven M. ; et al.	2016-07-28
Implementing Enhanced Scan Chain Diagnostics Via Bypass Multiplexing Structure App 20160216324 - Douskey; Steven M. ; et al.	2016-07-28
Shared channel masks in on-product test compression system Grant 9,378,318 - Douskey , et al. June 28, 2	2016-06-28
Collecting diagnostic data from chips Grant 9,372,232 - Douskey , et al. June 21, 2	2016-06-21
Partitioned Scan Chain Diagnostics Using Multiple Bypass Structures And Injection Points App 20160169968 - Douskey; Steven M. ; et al.	2016-06-16
Partitioned Scan Chain Diagnostics Using Multiple Bypass Structures And Injection Points App 20160169969 - Douskey; Steven M. ; et al.	2016-06-16
Inserting Bypass Structures At Tap Points To Reduce Latch Dependency During Scan Testing App 20160169967 - Douskey; Steven M. ; et al.	2016-06-16
Inserting Bypass Structures At Tap Points To Reduce Latch Dependency During Scan Testing App 20160169972 - Douskey; Steven M. ; et al.	2016-06-16
Test coverage of integrated circuits with masking pattern selection Grant 9,366,723 - Douskey , et al. June 14, 2	2016-06-14
Shared channel masks in on-product test compression system Grant 9,355,203 - Douskey , et al. May 31, 2	2016-05-31
Implementing MISR compression methods for test time reduction Grant 9,297,856 - Douskey , et al. March 29, 2	2016-03-29
Managing chip testing data Grant 9,285,423 - Douskey , et al. March 15, 2	2016-03-15
Managing Redundancy Repair Using Boundary Scans App 20150346279 - Douskey; Steven M. ; et al.	2015-12-03
Scan Chain Processing In A Partially Functional Chip App 20150346280 - Douskey; Steven M. ; et al.	2015-12-03
Managing redundancy repair using boundary scans Grant 9,201,117 - Douskey , et al. December 1, 2	2015-12-01
Self evaluation of system on a chip with multiple cores Grant 9,188,636 - Douskey , et al. November 17, 2	2015-11-17
Chip testing with exclusive OR Grant 9,151,800 - Douskey , et al. October 6, 2	2015-10-06
Hierarchal test block test pattern reduction in on-product test compression system Grant 9,134,375 - Douskey , et al. September 15, 2	2015-09-15
Hierarchal test block test pattern reduction in on-product test compression system Grant 9,134,373 - Douskey , et al. September 15, 2	2015-09-15
Shared Channel Masks In On-product Test Compression System App 20150254387 - Douskey; Steven M. ; et al.	2015-09-10
Hierarchal Test Block Test Pattern Reduction In On-product Test Compression System App 20150253382 - Douskey; Steven M. ; et al.	2015-09-10
Shared Channel Masks In On-product Test Compression System App 20150254390 - Douskey; Steven M. ; et al.	2015-09-10
Hierarchal Test Block Test Pattern Reduction In On-product Test Compression System App 20150253383 - Douskey; Steven M. ; et al.	2015-09-10
Test coverage of integrated circuits with test vector input spreading Grant 9,116,205 - Douskey , et al. August 25, 2	2015-08-25
Chip testing with exclusive OR Grant 9,110,135 - Douskey , et al. August 18, 2	2015-08-18
Self evaluation of system on a chip with multiple cores Grant 9,069,041 - Douskey , et al. June 30, 2	2015-06-30
Collecting Diagnostic Data From Chips App 20150168491 - Douskey; Steven M. ; et al.	2015-06-18
Managing Chip Testing Data App 20150168490 - Douskey; Steven M. ; et al.	2015-06-18
Multi-core processor comparison encoding Grant 9,032,256 - Douskey , et al. May 12, 2	2015-05-12
Implementing Misr Compression Methods For Test Time Reduction App 20150113348 - Douskey; Steven M. ; et al.	2015-04-23
Dynamic built-in self-test system Grant 9,003,244 - Douskey , et al. April 7, 2	2015-04-07
Chip Testing With Exclusive Or App 20150089312 - Douskey; Steven M. ; et al.	2015-03-26
Chip Testing With Exclusive Or App 20150089311 - Douskey; Steven M. ; et al.	2015-03-26
Dynamic Built-in Self-test System App 20150039957 - Douskey; Steven M. ; et al.	2015-02-05
Dynamic built-in self-test system Grant 8,898,530 - Douskey , et al. November 25, 2	2014-11-25
Managing Redundancy Repair Using Boundary Scans App 20140331097 - Douskey; Steven M. ; et al.	2014-11-06
Test Coverage Of Integrated Circuits With Masking Pattern Selection App 20140325298 - Douskey; Steven M. ; et al.	2014-10-30
Testing and operating a multiprocessor chip with processor redundancy Grant 8,868,975 - Bellofatto , et al. October 21, 2	2014-10-21
Test coverage of integrated circuits with masking pattern selection Grant 8,856,720 - Douskey , et al. October 7, 2	2014-10-07
Scan Chain Processing In A Partially Functional Chip App 20140298124 - Douskey; Steven M. ; et al.	2014-10-02
Multi-core Processor Comparison Encoding App 20140201575 - Douskey; Steven M. ; et al.	2014-07-17
Test Coverage Of Integrated Circuits With Masking Pattern Selection App 20140189612 - Douskey; Steven M. ; et al.	2014-07-03
Implementing enhanced pseudo random pattern generators with hierarchical linear feedback shift registers (LFSRs) Grant 8,762,803 - Douskey , et al. June 24, 2	2014-06-24
Self Evaluation Of System On A Chip With Multiple Cores App 20140157072 - Douskey; Steven M. ; et al.	2014-06-05
Self Evaluation Of System On A Chip With Multiple Cores App 20140157073 - Douskey; Steven M. ; et al.	2014-06-05
Test Coverage Of Integrated Circuits With Test Vector Input Spreading App 20140089750 - Douskey; Steven M. ; et al.	2014-03-27
Test Coverage Of Integrated Circuits With Test Vector Input Spreading App 20140089751 - Douskey; Steven M. ; et al.	2014-03-27
Test coverage of integrated circuits with masking pattern selection Grant 8,667,431 - Douskey , et al. March 4, 2	2014-03-04
Iimplementing enhanced aperture function calibration for logic built in self test (LBIST) Grant 8,627,162 - Douskey , et al. January 7, 2	2014-01-07
Dynamic scan Grant 8,516,318 - Douskey , et al. August 20, 2	2013-08-20
IMPLEMENTING ENHANCED PSEUDO RANDOM PATTERN GENERATORS WITH HIERARCHICAL LINEAR FEEDBACK SHIFT REGISTERS (LFSRs) App 20130191695 - Douskey; Steven M. ; et al.	2013-07-25
Iimplementing Enhanced Aperture Function Calibration For Logic Built In Self Test (lbist) App 20130151918 - Douskey; Steven M. ; et al.	2013-06-13
Testing And Operating A Multiprocessor Chip With Processor Redundancy App 20130031418 - Bellofatto; Ralph E. ; et al.	2013-01-31
Preventing circumvention of function disablement in an information handling system Grant 8,365,006 - Douskey , et al. January 29, 2	2013-01-29
Dynamic Scan App 20120159273 - Douskey; Steven M. ; et al.	2012-06-21
Preventing Circumvention Of Function Disablement In An Information Handling System App 20120017109 - Douskey; Steven M. ; et al.	2012-01-19
Self-test design methodology and technique for root-gated clocking structure Grant 7,830,195 - Douskey , et al. November 9, 2	2010-11-09
Self-test Design Methodology And Technique For Root-gated Clocking Structure App 20100231281 - Douskey; Steven M. ; et al.	2010-09-16
Lowering power consumption during logic built-in self-testing (LBIST) via channel suppression Grant 7,793,184 - Douskey September 7, 2	2010-09-07
Logic built-in self-test channel skipping during functional scan operations Grant 7,472,324 - Douskey December 30, 2	2008-12-30
Design structure for in-system redundant array repair in integrated circuits Grant 7,457,187 - Bright , et al. November 25, 2	2008-11-25
Method and apparatus for in-system redundant array repair on integrated circuits Grant 7,405,990 - Bright , et al. July 29, 2	2008-07-29
Lowering Power Consumption During Logic Built-In Self-Testing (LBIST) Via Channel Suppression App 20080172587 - Douskey; Steven M.	2008-07-17
Method and apparatus for in-system redundant array repair on integrated circuits Grant 7,397,709 - Bright , et al. July 8, 2	2008-07-08
Method And Apparatus For In-system Redundant Array Repair On Integrated Circuits App 20080080274 - Bright; Arthur A. ; et al.	2008-04-03
Design Structure For In-system Redundant Array Repair In Integrated Circuits App 20080062783 - BRIGHT; Arthur A. ; et al.	2008-03-13
Logic Built-in Self-test Channel Skipping During Functional Scan Operations App 20080052581 - Douskey; Steven M.	2008-02-28
Method And Apparatus For In-system Redundant Array Repair On Integrated Circuits App 20080037350 - Bright; Arthur A. ; et al.	2008-02-14
Method and apparatus for in-system redundant array repair on integrated circuits Grant 7,310,278 - Bright , et al. December 18, 2	2007-12-18
Method And Apparatus For In-system Redundant Array Repair On Integrated Circuits App 20070258296 - Bright; Arthur A. ; et al.	2007-11-08
Testing system interconnections using dynamic configuration and test generation Grant 5,617,430 - Angelotti , et al. April 1, 1	1997-04-01
Method and apparatus for detecting oscillator stuck faults in a level sensitive scan design (LSSD) system Grant 4,972,414 - Borkenhagen , et al. November 20, 1	1990-11-20

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