DOTAN; Noam
Patent Applications and Registrations
Patent applications and USPTO patent grants for DOTAN; Noam.The latest application filed is for "method and system for damping flow pulsation".
- DOTAN; Noam - Givat Yeshayahu IL
- Dotan; Noam - Givataim IL
- Dotan; Noam - Givatayim IL
- Dotan; Noam - Givaataim IL
| Patent | Date |
|---|---|
| Method And System For Damping Flow Pulsation App 20220220957 - DOTAN; Noam ; et al. | 2022-07-14 |
| Borehole pump and method of using the same Grant 11,289,973 - Dotan , et al. March 29, 2 | 2022-03-29 |
| Borehole Pump And Method Of Using The Same App 20200362848 - DOTAN; Noam ; et al. | 2020-11-19 |
| Borehole pump and method of using the same Grant 10,753,355 - Dotan , et al. A | 2020-08-25 |
| Borehole Pump And Method Of Using The Same App 20190234395 - DOTAN; Noam ; et al. | 2019-08-01 |
| System for detection of wafer defects Grant 7,961,763 - Furman , et al. June 14, 2 | 2011-06-14 |
| System for detection of wafer defects Grant 7,843,559 - Furman , et al. November 30, 2 | 2010-11-30 |
| Method and apparatus for detecting defects in wafers Grant 7,813,541 - Sali , et al. October 12, 2 | 2010-10-12 |
| Multi mode inspection method and apparatus Grant 7,804,590 - Furman , et al. September 28, 2 | 2010-09-28 |
| Apparatus for determining optimum position of focus of an imaging system Grant 7,633,041 - Furman , et al. December 15, 2 | 2009-12-15 |
| System for detection of water defects Grant 7,525,659 - Furman , et al. April 28, 2 | 2009-04-28 |
| Multi mode inspection method and apparatus App 20090091749 - Furman; Dov ; et al. | 2009-04-09 |
| Multi mode inspection method and apparatus Grant 7,480,039 - Furman , et al. January 20, 2 | 2009-01-20 |
| System for detection of wafer defects Grant 7,477,383 - Furman , et al. January 13, 2 | 2009-01-13 |
| Multi mode inspection method and apparatus App 20070291256 - Furman; Dov ; et al. | 2007-12-20 |
| Multi mode inspection method and apparatus Grant 7,274,444 - Furman , et al. September 25, 2 | 2007-09-25 |
| Fiber optical illumination system Grant 7,260,298 - Furman , et al. August 21, 2 | 2007-08-21 |
| Fiber optical illumination system App 20070146694 - Furman; Dov ; et al. | 2007-06-28 |
| System for detection of wafer defects Grant 7,180,586 - Neumann , et al. February 20, 2 | 2007-02-20 |
| System for detection of wafer defects App 20070019856 - Furman; Dov ; et al. | 2007-01-25 |
| System for detection of wafer defects App 20070013903 - Furman; Dov ; et al. | 2007-01-18 |
| System for detection of wafer defects App 20060244956 - Furman; Dov ; et al. | 2006-11-02 |
| System for detection of wafer defects App 20060244957 - Furman; Dov ; et al. | 2006-11-02 |
| System for detection of wafer defects App 20060244958 - Furman; Dov ; et al. | 2006-11-02 |
| Method and apparatus for detecting defects in wafers App 20060193507 - Sali; Erez ; et al. | 2006-08-31 |
| Programmable spatial filter for wafer inspection App 20060012781 - Fradkin; Keren ; et al. | 2006-01-19 |
| Multi mode inspection method and apparatus App 20060007434 - Furman; Dov ; et al. | 2006-01-12 |
| Fiber optical illumination system App 20050180707 - Furman, Dov ; et al. | 2005-08-18 |
| System for detection of wafer defects App 20050110987 - Furman, Dov ; et al. | 2005-05-26 |
| Fiber optical illumination system Grant 6,892,013 - Furman , et al. May 10, 2 | 2005-05-10 |
| System for detection of wafer defects App 20040146295 - Furman, Dov ; et al. | 2004-07-29 |
| Fiber optical illumination system App 20040136665 - Furman, Dov ; et al. | 2004-07-15 |
| Secondary electron spectroscopy method and system Grant 6,627,886 - Shachal , et al. September 30, 2 | 2003-09-30 |
| Focusing method and system Grant 6,521,891 - Dotan , et al. February 18, 2 | 2003-02-18 |
| Apparatus and method for reviewing defects on an object Grant 6,407,373 - Dotan June 18, 2 | 2002-06-18 |
| System and method for automatic analysis of defect material on semiconductors Grant 6,407,386 - Dotan , et al. June 18, 2 | 2002-06-18 |
| Determining defect depth and contour information in wafer structures using multiple SEM images Grant 6,353,222 - Dotan March 5, 2 | 2002-03-05 |
| SEM image enhancement using narrow band detection and color assignment Grant 6,201,240 - Dotan , et al. March 13, 2 | 2001-03-13 |
| Reliable defect detection using multiple perspective scanning electron microscope images Grant 5,659,172 - Wagner , et al. August 19, 1 | 1997-08-19 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.
| 