DOROUGH; Michael J.

Patent Applications and Registrations

Patent applications and USPTO patent grants for DOROUGH; Michael J..The latest application filed is for "apparatus and method for determining device participation in an energy management program".

Company Profile

0.8.13

DOROUGH; Michael J. - Meridian ID

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Apparatus And Method For Determining Device Participation In An Energy Management Program App 20150005968 - DOROUGH; Michael J.	2015-01-01
Dynamically adaptable semiconductor parametric testing Grant 7,383,147 - Dorough , et al. June 3, 2	2008-06-03
Intelligent measurement modular semiconductor parametric test system Grant 7,337,088 - Velichko , et al. February 26, 2	2008-02-26
Concurrent control of semiconductor parametric testing App 20070112538 - Velichko; Sergey A. ; et al.	2007-05-17
Dynamically adaptable semiconductor parametric testing Grant 7,165,004 - Dorough , et al. January 16, 2	2007-01-16
Dynamically adaptable semiconductor parametric testing Grant 7,162,386 - Dorough , et al. January 9, 2	2007-01-09
Dynamically adaptable semiconductor parametric testing Grant 7,139,672 - Dorough , et al. November 21, 2	2006-11-21
Intelligent Measurement Modular Semiconductor Parametric Test System App 20060212253 - Velichko; Sergey A. ; et al.	2006-09-21
Dynamically adaptable semiconductor parametric testing App 20060125509 - Dorough; Michael J. ; et al.	2006-06-15
Dynamically adaptable semiconductor parametric testing App 20060122803 - Dorough; Michael J. ; et al.	2006-06-08
Dynamic creation and modification of wafer test maps during wafer testing App 20060064268 - Dorough; Michael J. ; et al.	2006-03-23
Dynamic creation and modification of wafer test maps during wafer testing Grant 7,010,451 - Dorough , et al. March 7, 2	2006-03-07
Remote semiconductor microscopy Grant 6,859,760 - Dorough February 22, 2	2005-02-22
Dynamically adaptable semiconductor parametric testing App 20050021273 - Dorough, Michael J. ; et al.	2005-01-27
Dynamic creation and modification of wafer test maps during wafer testing App 20040210413 - Dorough, Michael J. ; et al.	2004-10-21
Dynamically adaptable semiconductor parametric testing App 20030212523 - Dorough, Michael J. ; et al.	2003-11-13
Remote semiconductor microscopy App 20030208340 - Dorough, Michael J.	2003-11-06
Intelligent measurement modular semiconductor parametric test system App 20030028343 - Velichko, Sergey A. ; et al.	2003-02-06
Concurrent control of semiconductor parametric testing App 20020152046 - Velichko, Sergey A. ; et al.	2002-10-17
Remote semiconductor microscopy App 20020111775 - Dorough, Michael J.	2002-08-15
Remote semiconductor microscopy Grant 6,370,487 - Dorough April 9, 2	2002-04-09

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