Dor; Amos

Patent Applications and Registrations

Patent applications and USPTO patent grants for Dor; Amos.The latest application filed is for "system to identify a wafer manufacturing problem and method therefor".

Company Profile

0.5.8

Dor; Amos - Sunnyvale CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Correlation of end-of-line data mining with process tool data mining Grant 7,401,066 - Beinglass , et al. July 15, 2	2008-07-15
System to identify a wafer manufacturing problem and method therefor Grant 6,885,977 - Gavra , et al. April 26, 2	2005-04-26
System to identify a wafer manufacturing problem and method therefor App 20040122859 - Gavra, Yifah ; et al.	2004-06-24
Defect knowledge library Grant 6,744,266 - Dor , et al. June 1, 2	2004-06-01
Method and apparatus for providing communication between a defect source identifier and a tool data collection and control system Grant 6,714,884 - Dor , et al. March 30, 2	2004-03-30
Defect source identifier Grant 6,701,259 - Dor , et al. March 2, 2	2004-03-02
Correlation of end-of-line data mining with process tool data mining App 20030182252 - Beinglass, Israel ; et al.	2003-09-25
Defect source identifier with static manufacturing execution system App 20030135295 - Dor, Amos ; et al.	2003-07-17
Defect source identifier App 20020161532 - Dor, Amos ; et al.	2002-10-31
Defect knowledge library App 20020072162 - Dor, Amos ; et al.	2002-06-13
Method and apparatus for providing communication between a defect source identifier and a tool data collection and control system App 20020069024 - Dor, Amos ; et al.	2002-06-06
Method and apparatus for communicating images, data, or other information in a defect source identifier App 20020065900 - Dor, Amos ; et al.	2002-05-30
Method, computer readable medium and apparatus for accessing a defect knowledge library of a defect source identification system App 20020046001 - Dor, Amos ; et al.	2002-04-18

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