Doong; Yih-Yuh

Patent Applications and Registrations

Patent applications and USPTO patent grants for Doong; Yih-Yuh.The latest application filed is for "accurate capacitance measurement for ultra large scale integrated circuits".

Company Profile

2.14.9

Doong; Yih-Yuh - Zhubei TW
Doong; Yih-Yuh - Hsin-Chu TW
Doong; Yih-Yuh - Shin-chu TW
Doong; Yih-Yuh - Kaohsiung TW
Doong, Yih-Yuh - Kaohsiung City TW
Doong; Yih-Yuh - Kaoshsiung TW

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Direct access memory characterization vehicle Grant 10,410,735 - Doong , et al. Sept	2019-09-10
Direct probing characterization vehicle for transistor, capacitor and resistor testing Grant 10,380,305 - Doong , et al. A	2019-08-13
On-chip capacitance measurement for memory characterization vehicle Grant 10,096,378 - Doong , et al. October 9, 2	2018-10-09
Accurate capacitance measurement for ultra large scale integrated circuits Grant 8,115,500 - Doong , et al. February 14, 2	2012-02-14
Method for shape and timing equivalent dimension extraction Grant 8,037,575 - Cheng , et al. October 18, 2	2011-10-18
Accurate Capacitance Measurement for Ultra Large Scale Integrated Circuits App 20110168995 - Doong; Yih-Yuh ; et al.	2011-07-14
Accurate capacitance measurement for ultra large scale integrated circuits Grant 7,880,494 - Doong , et al. February 1, 2	2011-02-01
Test pad design for reducing the effect of contact resistances Grant 7,825,678 - Doong , et al. November 2, 2	2010-11-02
Electrical parameter extraction for integrated circuit design Grant 7,783,999 - Ou , et al. August 24, 2	2010-08-24
Accurate capacitance measurement for ultra large scale integrated circuits Grant 7,772,868 - Doong , et al. August 10, 2	2010-08-10
Accurate Capacitance Measurement for Ultra Large Scale Integrated Circuits App 20100156453 - Doong; Yih-Yuh ; et al.	2010-06-24
Test Pad Design for Reducing the Effect of Contact Resistances App 20100045325 - Doong; Yih-Yuh ; et al.	2010-02-25
Method For Shape And Timing Equivalent Dimension Extraction App 20090222785 - CHENG; Ying-Chou ; et al.	2009-09-03
Electrical Parameter Extraction for Integrated Circuit Design App 20090187866 - Ou; Tsong-Hua ; et al.	2009-07-23
Accurate Capacitance Measurement for Ultra Large Scale Integrated Circuits App 20090002012 - Doong; Yih-Yuh ; et al.	2009-01-01
Versatile semiconductor test structure array Grant 7,405,585 - Doong July 29, 2	2008-07-29
Versatile semiconductor test structure array App 20070200587 - Doong; Yih-Yuh	2007-08-30
Model-based insertion of irregular dummy features App 20050205961 - Doong, Yih Yuh	2005-09-22
Method and device for addressable failure site test structure Grant 6,577,149 - Doong , et al. June 10, 2	2003-06-10
Method and device for semiconductor wafer testing App 20020089345 - Doong, Yih-Yuh ; et al.	2002-07-11
Method of forming precisely cross-sectioned electron-transparent samples Grant 5,940,678 - Doong , et al. August 17, 1	1999-08-17
Method of removing thin film layers of a semiconductor component Grant 5,926,688 - Lee , et al. July 20, 1	1999-07-20
Method for preventing charging effect and thermal damage in charged-particle microscopy Grant 5,747,803 - Doong May 5, 1	1998-05-05

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