loadpatents
name:-0.010219097137451
name:-0.015742063522339
name:-0.004000186920166
Donnelly; Vincent M. Patent Filings

Donnelly; Vincent M.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Donnelly; Vincent M..The latest application filed is for "atomic layer etching with pulsed plasmas".

Company Profile
2.14.9
  • Donnelly; Vincent M. - Houston TX
  • Donnelly; Vincent M - Houston TX
  • Donnelly; Vincent M. - Berkeley Heights NJ
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Atomic layer etching with pulsed plasmas
Grant 10,515,782 - Donnelly , et al. Dec
2019-12-24
Systems and methods for rapidly fabricating nanopatterns in a parallel fashion over large areas
Grant 10,207,469 - Donnelly , et al. Feb
2019-02-19
Atomic Layer Etching with Pulsed Plasmas
App 20180226227 - Donnelly; Vincent M. ;   et al.
2018-08-09
Systems And Methods For Rapidly Fabricating Nanopatterns In A Parallel Fashion Over Large Areas
App 20170361551 - Donnelly; Vincent M. ;   et al.
2017-12-21
Low electron temperature microwave surface-wave plasma (SWP) processing method and apparatus
Grant 8,968,588 - Zhao , et al. March 3, 2
2015-03-03
Low Electron Temperature Microwave Surface-wave Plasma (swp) Processing Method And Apparatus
App 20130256272 - Zhao; Jianping ;   et al.
2013-10-03
System and method for nano-pantography
Grant 8,030,620 - Donnelly , et al. October 4, 2
2011-10-04
Atomic Layer Etching With Pulsed Plasmas
App 20110139748 - DONNELLY; Vincent M. ;   et al.
2011-06-16
Method and apparatus for nano-pantography
Grant 7,883,839 - Donnelly , et al. February 8, 2
2011-02-08
Hyperthermal neutral beam source and method of operating
Grant 7,638,759 - Economou , et al. December 29, 2
2009-12-29
System And Method For Nano-pantography
App 20090283215 - Donnelly; Vincent M. ;   et al.
2009-11-19
Hyperthermal Neutral Beam Source And Method Of Operating
App 20080135742 - Economou; Demetre J. ;   et al.
2008-06-12
Hyperthermal neutral beam source and method of operating
Grant 7,358,484 - Economou , et al. April 15, 2
2008-04-15
Method and apparatus for nano-pantography
App 20070131646 - Donnelly; Vincent M. ;   et al.
2007-06-14
Hyperthermal neutral beam source and method of operating
App 20070069118 - Economou; Demetre J. ;   et al.
2007-03-29
Deposition of III-V semiconductor materials
Grant 4,645,687 - Donnelly , et al. February 24, 1
1987-02-24
Etching techniques
Grant 4,498,953 - Cook , et al. February 12, 1
1985-02-12
Crystallographic etching of III-V semiconductor materials
Grant 4,397,711 - Donnelly , et al. August 9, 1
1983-08-09
Spectroscopic monitoring of gas-solid processes
Grant 4,394,237 - Donnelly , et al. July 19, 1
1983-07-19
Plasma-assisted etch process with endpoint detection
Grant 4,377,436 - Donnelly , et al. March 22, 1
1983-03-22
Radiation induced deposition of metal on semiconductor surfaces
Grant 4,359,485 - Donnelly , et al. November 16, 1
1982-11-16

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed