DONG; Zhonghua

Patent Applications and Registrations

Patent applications and USPTO patent grants for DONG; Zhonghua.The latest application filed is for "cross-talk cancellation in multiple charged-particle beam inspection".

Company Profile

8.9.14

DONG; Zhonghua - Sunnyvale CA
Dong; Zhonghua - Chaoqing CN

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Cross-talk Cancellation In Multiple Charged-particle Beam Inspection App 20220301811 - FANG; Wei ; et al.	2022-09-22
Field programmable detector array Grant 11,430,629 - Wang , et al. August 30, 2	2022-08-30
Method and apparatus for charged particle detection Grant 11,295,930 - Wang , et al. April 5, 2	2022-04-05
Systems And Methods For Focusing Charged -particle Beams App 20220068590 - LUO; Ying ; et al.	2022-03-03
Apparatus and method for detecting time-dependent defects in a fast-charging device Grant 11,175,248 - Ma , et al. November 16, 2	2021-11-16
Architecture For Large Active Area High Speed Detector App 20210134557 - WANG; Yongxin ; et al.	2021-05-06
Pixel Shape And Section Shape Selection For Large Active Area High Speed Detector App 20210043416 - WANG; Yongxin ; et al.	2021-02-11
Methods Of Inspecting Samples With Multiple Beams Of Charged Particles App 20200271598 - TSENG; Kuo-Feng ; et al.	2020-08-27
Switch Matrix Design For Beam Image System App 20200227229 - WANG; Yongxin ; et al.	2020-07-16
Field Programmable Detector Array App 20200219696 - WANG; Yongxin ; et al.	2020-07-09
Apparatus And Method For Detecting Time-dependent Defects In A Fast-charging Device App 20200088659 - MA; Long ; et al.	2020-03-19
Method And Apparatus For Charged Particle Detection App 20200027694 - WANG; Yongxin ; et al.	2020-01-23
Semiconductor Charged Particle Detector For Microscopy App 20190378682 - Wang; Yongxin ; et al.	2019-12-12
Portable power supply Grant D802,530 - Adams , et al. November 14, 2	2017-11-14
Laser SDE effect compensation by adaptive tuning Grant 9,601,311 - Luo , et al. March 21, 2	2017-03-21
Laser SDE Effect Compensation by Adaptive Tuning App 20160260579 - Luo; Ying ; et al.	2016-09-08
Hot spot identification, inspection, and review Grant 9,330,987 - Lin , et al. May 3, 2	2016-05-03
Hot Spot Identification, Inspection, and Review App 20150069232 - Lin; Steve ; et al.	2015-03-12
Charged particle system for reticle/wafer defects inspection and review Grant 8,519,333 - Kuan , et al. August 27, 2	2013-08-27
Charged Particle System For Reticle / Wafer Defects Inspection And Review App 20120280125 - KUAN; CHIYAN ; et al.	2012-11-08
System and method to determine focus parameters during an electron beam inspection Grant 7,705,298 - Liu , et al. April 27, 2	2010-04-27
System And Method To Determine Focus Parameters During An Electron Beam Inspection App 20090108199 - LIU; Xuedong ; et al.	2009-04-30

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