Dolev; Ido

Patent Applications and Registrations

Patent applications and USPTO patent grants for Dolev; Ido.The latest application filed is for "overlay metrology using spectroscopic phase".

Company Profile

2.10.10

Dolev; Ido - Milpitas CA
Dolev; Ido - Manof IL
Dolev; Ido - Rehovot IL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Overlay Metrology Using Spectroscopic Phase App 20220299308 - Shchegrov; Andrei V. ; et al.	2022-09-22
Method of measuring misregistration of semiconductor devices Grant 11,226,566 - Volkovich , et al. January 18, 2	2022-01-18
Computerized method for configuring an inspection system, computer program product and an inspection system Grant 11,029,253 - Shoham , et al. June 8, 2	2021-06-08
Method Of Measuring Misregistration Of Semiconductor Devices App 20210149314 - VOLKOVICH; Roie ; et al.	2021-05-20
Method of measuring misregistration of semiconductor devices Grant 10,928,739 - Volkovich , et al. February 23, 2	2021-02-23
Method Of Measuring Misregistration Of Semiconductor Devices App 20200271596 - VOLKOVICH; Roie ; et al.	2020-08-27
Asymmetrical magnification inspection system and illumination module Grant 10,481,101 - Feldman , et al. Nov	2019-11-19
Computerized Method For Configuring An Inspection System, Computer Program Product And An Inspection System App 20180284031 - Shoham; Amir ; et al.	2018-10-04
Asymmetrical Magnification Inspection System And Illumination Module App 20180209915 - Feldman; Haim ; et al.	2018-07-26
Inspection system and a method for evaluating an exit pupil of an inspection system Grant 9,846,128 - Ilan , et al. December 19, 2	2017-12-19
Inspection System and a Method for Evaluating an Exit Pupil of an Inspection System App 20170205359 - Ilan; Harel ; et al.	2017-07-20
Systems And Methods For Inspecting An Object App 20170016834 - Feldman; Haim ; et al.	2017-01-19
Systems and methods for inspecting an object Grant 9,535,014 - Feldman , et al. January 3, 2	2017-01-03
Inspection having a segmented pupil Grant 9,354,212 - Berlatzky , et al. May 31, 2	2016-05-31
Inspection Having A Segmented Pupil App 20150193926 - Berlatzky; Yoav ; et al.	2015-07-09
Mapping variations of a surface Grant 8,724,882 - Meshulach , et al. May 13, 2	2014-05-13
Scanning microscopy using inhomogeneous polarization Grant 8,228,601 - Meshulach , et al. July 24, 2	2012-07-24
Mapping Variations Of A Surface App 20110158502 - Meshulach; Doron ; et al.	2011-06-30
Scanning Microscopy Using Inhomogeneous Polarization App 20090284835 - Meshulach; Doron ; et al.	2009-11-19

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